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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
821 How to Effectively Reduce Tens of Millions of Tests: An Industrial Case Study on Adaptive Random Testing
Zhiyi Zhang, Yabin Wang, Ziyuan Wang, Ju Qian IEEE Transactions on Reliability 68 4 1429–1443 2019 12.52
平均評価: / 5 ( 件のレビュー)
822 Imperfect Inspection of a System With Unrevealed Failure and an Unrevealed Defective State
Cristiano A. V. Cavalcante, Philip A. Scarf, M. D. Berrade IEEE Transactions on Reliability 68 2 764–775 2019 12.52
平均評価: / 5 ( 件のレビュー)
823 Design and Risk Evaluation of Reliability Demonstration Test for Hierarchical Systems With Multilevel Information Aggregation
Fumio Machida, Jianwen Xiang, Kumiko Tadano, Yoshiharu Maeno IEEE Transactions on Reliability 66 1 135–147 2017 12.52
平均評価: / 5 ( 件のレビュー)
824 DFuzzer: Diversity-Driven Seed Queue Construction of Fuzzing for Deep Learning Models
Hepeng Dai, Chang-Ai Sun, Huai Liu, Xiangyu Zhang IEEE Transactions on Reliability 73 2 1075–1089 2024 12.5
平均評価: / 5 ( 件のレビュー)
825 A Machine Learning Algorithm for Reliability Analysis
Maria Luz Gámiz, Fernando Jesus Navas-Gómez, Rocío Raya-Miranda IEEE Transactions on Reliability 70 2 535–546 2021 12.5
平均評価: / 5 ( 件のレビュー)
826 Protecting the Internet of Vehicles Against Advanced Persistent Threats: A Bayesian Stackelberg Game
Talal Halabi, Omar Abdel Wahab, Ranwa Al Mallah, Mohammad Zulkernine IEEE Transactions on Reliability 70 3 970–985 2021 12.5
平均評価: / 5 ( 件のレビュー)
827 A Compiler Technique for Processor-Wide Protection From Soft Errors in Multithreaded Environments
Moslem Didehban, Aviral Shrivastava IEEE Transactions on Reliability 67 1 249–263 2018 12.5
平均評価: / 5 ( 件のレビュー)
828 Impact of the Real-Time Thermal Loading on the Bulk Electric System Reliability
Jiashen Teh, Ching-Ming Lai, Yu-Huei Cheng IEEE Transactions on Reliability 66 4 1110–1119 2017 12.49
平均評価: / 5 ( 件のレビュー)
829 Gated Homogeneous Fusion Networks With Jointed Feature Extraction for Defect Prediction
Dingbang Fang, Shaoying Liu, Ai Liu IEEE Transactions on Reliability 71 2 512–526 2022 12.48
平均評価: / 5 ( 件のレビュー)
830 Transition Algebra for Software Testing
Pan Liu, Yihao Li, Huaikou Miao IEEE Transactions on Reliability 70 4 1438–1454 2021 12.48
平均評価: / 5 ( 件のレビュー)