Powered by Engineering Brain, Japan | What is PKV? | PKV Methodology | KnowledgeRank v4.0.0: PKV Trends of My Authored Papers Are Now Available on My Page

アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
821 Optimal Periodic Inspections and Activation Sequencing Policy in Standby Systems With Condition-Based Mode Transfer
Zhenxu Zhou, Qin Zhang IEEE Transactions on Reliability 66 1 189–201 2017 9.58
平均評価: / 5 ( 件のレビュー)
822 A Modular Fault Diagnosis and Prognosis Method for Hydro-Control Valve System Based on Redundancy in Multisensor Data Information
Mojtaba Kordestani, Amir Zanj, Marcos E. Orchard, Mehrdad Saif IEEE Transactions on Reliability 68 1 330–341 2019 9.56
平均評価: / 5 ( 件のレビュー)
823 Anonymous Dynamic Formation Control of Multiagent Systems With Obstacle Avoidance
Weibin Liang, Xiyan Sun, Yuanfa Ji, Jianhui Wu, Xinyi Liu IEEE Transactions on Reliability 75 1 1079–1093 2026 9.48
平均評価: / 5 ( 件のレビュー)
824 Adaptive Interval Observer for Sensor Fault Detection with Minimum Detectable Fault Analysis under Unknown Time-Varying Parameters
Zengwei Li, Jun-Sheng Wang IEEE Transactions on Reliability 75 1 1106–1117 2026 9.46
平均評価: / 5 ( 件のレビュー)
825 Inferences on Lifetime Performance Index of Weibull Products Under Step-Stress Setup
Sarat Sindhu Mukhopadhyay, Viswakala K.V., Gijo E.V. IEEE Transactions on Reliability 74 4 4870–4884 2025 9.41
平均評価: / 5 ( 件のレビュー)
826 Reliability Analysis of Limited Failure One-Shot Devices
Narayanaswamy Balakrishnan, Elena Castilla IEEE Transactions on Reliability 75 1 157–170 2026 9.39
平均評価: / 5 ( 件のレビュー)
827 A Generalized Degradation Model Based on Semi-Physics-Informed Neural Stochastic Differential Equation
Zirong Wang, Zhen Chen, Tangbin Xia, Ershun Pan IEEE Transactions on Reliability 74 4 5820–5834 2025 9.37
平均評価: / 5 ( 件のレビュー)
828 Functional and Defect Study in Deep Learning Libraries: A Complex Network Perspective
Xuhui Lu, Zheng Zheng, Fangyun Qin, Xiangyue Ma, Qing Cai IEEE Transactions on Reliability 74 4 4900–4914 2025 9.37
平均評価: / 5 ( 件のレビュー)
829 What Causes Bugs in Numerical Simulation Software? An Empirical Study
Xiaochen Li, Youcheng Zhu, Shikai Guo, He Jiang IEEE Transactions on Reliability 74 3 3383–3397 2025 9.36
平均評価: / 5 ( 件のレビュー)
830 Stacked Ensemble Deep Learning for the Classification of Nonfunctional Requirements
Ayah Alqurashi, Luay Alawneh IEEE Transactions on Reliability 74 3 3221–3235 2025 9.34
平均評価: / 5 ( 件のレビュー)