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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
761 EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution
Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling IEEE Transactions on Reliability 65 2 973–991 2016 9.71
平均評価: / 5 ( 件のレビュー)
762 A Diversity Model Based on Failure Distribution and its Application in Safety Cases
Luping Chen, John H. R. May IEEE Transactions on Reliability 65 3 1149–1162 2016 9.71
平均評価: / 5 ( 件のレビュー)
763 Small Sample Fault Diagnosis Using Gap-Regularized Loss and Multiscale Attention CNN
Lihao Ye, Ke Zhang, Bin Jiang, Silvio Simani, Xue Li IEEE Transactions on Reliability 75 1 1599–1610 2026 9.69
平均評価: / 5 ( 件のレビュー)
764 A Compact CNN-Transformer Model for Robust Fault Diagnosis in Large-Scale Chemical Processes
Pratyush Kumar Pal, Sumona Ray, Narottam Behera, Somnath Chowdhury, Abhiram Hens, Sandip Kumar Lahiri International Journal of Prognostics and Health Management 17 1 4744–None 2026 9.69
平均評価: / 5 ( 件のレビュー)
765 Towards a Universal Vibration Analysis Dataset
Mert Sehri, Igor Varejão, Zehui Hua, Vitor Bonella, Adriano Santos, Francisco de Assis Boldt, Patrick Dumond, Flavio Miguel Varejão International Journal of Prognostics and Health Management 16 3 4239–None 2025 9.69
平均評価: / 5 ( 件のレビュー)
766 difLIME
David Solís-Martín, Juan Galán-Páez, Joaquín Borrego-Díaz International Journal of Prognostics and Health Management 16 3 4166–None 2025 9.69
平均評価: / 5 ( 件のレビュー)
767 Statistical Analysis and Runtime Monitoring for an AI-based Autonomous Centerline Tracking System
Yuning He, Johann Schumann International Journal of Prognostics and Health Management 15 3 3860–None 2024 9.69
平均評価: / 5 ( 件のレビュー)
768 A History of Editorship of the IEEE Transactions on Reliability
Phillip A. Laplante IEEE Transactions on Reliability 73 1 12–14 2024 9.69
平均評価: / 5 ( 件のレビュー)
769 Utilizing Parity Checking to Optimize Soft Error Detection Through Low-Level Reexecution
Brent De Blaere, Jens Vankeirsbilck, Jeroen Boydens IEEE Transactions on Reliability 72 4 1355–1366 2023 9.69
平均評価: / 5 ( 件のレビュー)
770 Parallel Batch Processing Machine Scheduling Under Two-Dimensional Bin-Packing Constraints
Xiaopan Zhang, Mengjie Shan, Ju Zeng IEEE Transactions on Reliability 72 3 1265–1275 2023 9.69
平均評価: / 5 ( 件のレビュー)