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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
701 Generalized Fiducial Inference for Accelerated Life Tests With Weibull Distribution and Progressively Type-II Censoring
Piao Chen, Ancha Xu, Zhi-Sheng Ye IEEE Transactions on Reliability 65 4 1737–1744 2016 13.33
平均評価: / 5 ( 件のレビュー)
702 Editorial Degradation and Maintenance in Reliability
Winston Shieh IEEE Transactions on Reliability 72 3 862–862 2023 13.31
平均評価: / 5 ( 件のレビュー)
703 Efficient Multiparty Fully Homomorphic Encryption With Computation Fairness and Error Detection in Privacy Preserving Multisource Data Mining
Guanglai Guo, Yan Zhu, E. Chen, Ruyun Yu, Lejun Zhang, Kewei Lv, Rongquan Feng IEEE Transactions on Reliability 72 4 1308–1323 2023 13.31
平均評価: / 5 ( 件のレビュー)
704 Prognostics and Health Management for an Overhead Contact Line System - A Review
Mehdi Brahimi, Kamal Medjaher, Mohammed Leouatni, Noureddine Zerhouni International Journal of Prognostics and Health Management 8 3 2665–None 2017 13.31
平均評価: / 5 ( 件のレビュー)
705 Empirical Studies of a Two-Stage Data Preprocessing Approach for Software Fault Prediction
Wangshu Liu, Shulong Liu, Qing Gu, Jiaqiang Chen, Xiang Chen, Daoxu Chen IEEE Transactions on Reliability 65 1 38–53 2016 13.31
平均評価: / 5 ( 件のレビュー)
706 Classical Optimal Replacement Strategies Revisited
Maxim Finkelstein, Mahmood Shafiee, Anselme N. Kotchap IEEE Transactions on Reliability 65 2 540–546 2016 13.31
平均評価: / 5 ( 件のレビュー)
707 Smart Manufacturing PHM
Brian A. Weiss, Philip Freeman, Jay Lee, Radu Pavel International Journal of Prognostics and Health Management 7 3 2415–None 2016 13.31
平均評価: / 5 ( 件のレビュー)
708 Toward Improved Reliability of Deep Learning Based Systems Through Online Relabeling of Potential Adversarial Attacks
Shawqi Al-Maliki, Faissal El Bouanani, Kashif Ahmad, Mohamed Abdallah, Dinh Thai Hoang, Dusit Niyato, Ala Al-Fuqaha IEEE Transactions on Reliability 72 4 1367–1382 2023 13.29
平均評価: / 5 ( 件のレビュー)
709 Dependability Analysis of a System Using State-Space Modeling Techniques: A Systematic Review
Kumar Gaurav, Vinay Kumar, Binod Kumar Singh IEEE Transactions on Reliability 72 4 1340–1354 2023 13.29
平均評価: / 5 ( 件のレビュー)
710 HMM-Based Joint Modeling of Condition Monitoring Signals and Failure Event Data for Prognosis
Akash Deep, Shiyu Zhou, Dharmaraj Veeramani, Yong Chen IEEE Transactions on Reliability 72 3 878–888 2023 13.29
平均評価: / 5 ( 件のレビュー)