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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
671 Optimization of Nondestructive Evaluation Techniques for Bonded Components Through Model-Assisted POD Analysis
Gawher Ahmad Bhat, Damira Smagulova, Elena Jasiunienė IEEE Transactions on Reliability 75 1 555–569 2026 10.35
平均評価: / 5 ( 件のレビュー)
672 Mission Abort Policy for Coherent Systems With Heterogeneous Components
Amin Karimi, Mahdi Tavangar, Maxim Finkelstein IEEE Transactions on Reliability 74 4 4704–4718 2025 10.34
平均評価: / 5 ( 件のレビュー)
673 Functional Safety Design for Autonomous Vehicle Brake System With Machine Learning Technique
Jianyu Duan, Duan Jianqing, Zhen Wang, Xiaopu Jing, Sun Lingyu IEEE Transactions on Reliability 74 4 5402–5411 2025 10.32
平均評価: / 5 ( 件のレビュー)
674 Reliability Evaluation for a Circular Con/k/n:F System With a Novel Differential Repair Policy
Shan Gao, Jinting Wang, Qin Chen IEEE Transactions on Reliability 74 3 3098–3111 2025 10.32
平均評価: / 5 ( 件のレビュー)
675 Fed-OLF: Federated Oversampling Learning Framework for Imbalanced Software Defect Prediction Under Privacy Protection
Xiaowen Hu, Ming Zheng, Rui Zhu, Xuan Zhang, Zhi Jin IEEE Transactions on Reliability 74 3 3266–3280 2025 10.32
平均評価: / 5 ( 件のレビュー)
676 Dynamic Event-Triggered Model-Free Reinforcement Learning for Cooperative Control of Multiagent Systems
Ke Wang, Zhuo Tang, Chaoxu Mu IEEE Transactions on Reliability 74 3 3166–3179 2025 10.28
平均評価: / 5 ( 件のレビュー)
677 Enhancing Fine-Grained Smart Contract Vulnerability Detection Through Domain Features and Transparent Interpretation
Qing Huang, Yu He, Zhenchang Xing, Min Yu, Xiwei Xu, Qinghua Lu IEEE Transactions on Reliability 74 3 4207–4221 2025 10.28
平均評価: / 5 ( 件のレビュー)
678 Graph Embedding-Based Bayesian Network for Fault Isolation in Complex Equipment
Liqiao Xia, Pai Zheng, Manuel Herrera, Yongshi Liang, Xinyu Li, Liang Gao IEEE Transactions on Reliability 74 3 3897–3910 2025 10.28
平均評価: / 5 ( 件のレビュー)
679 MetaMFL: Metamorphic Multiple Fault Localization Without Test Oracles
Lingfeng Fu, Zhenyu Wu, Yan Lei, Meng Yan IEEE Transactions on Reliability 74 3 3236–3250 2025 10.24
平均評価: / 5 ( 件のレビュー)
680 TSV Built-In Self-Repair Architecture for Lifespan Reliability Enhancement of HBM
Donghyun Han, Duyeon Won, Sunghoon Kim, Sungho Kang IEEE Transactions on Reliability 74 3 4143–4157 2025 10.24
平均評価: / 5 ( 件のレビュー)