アクセスランキング（PKV）
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Jubilee Review: The 65 Years of the ASME Machine Design Award (1958–2023)
| 順位 | タイトル | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 雑誌 | 巻 | 号 | ページ | 年 | PKVアクセス数 | |||
| 661 | Time-Variant Reliability-Based Design Optimization Using an Equivalent Most Probable Point | ||||||||
| Teng Fang, Chao Jiang, Zhiliang Huang, Xinpeng Wei, Xu Han | IEEE Transactions on Reliability | 68 | 1 | 175–186 | 2019 | 13.41 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 662 | Attention and Long Short-Term Memory Network for Remaining Useful Lifetime Predictions of Turbofan Engine Degradation | ||||||||
| Paulo Roberto de Oliveira da Costa, Alp Akcay, Yingqian Zhang, Uzay Kaymak | International Journal of Prognostics and Health Management | 10 | 4 | 2623–None | 2019 | 13.41 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 663 | Stochastic Process for the Availability Assessment of Single-Feeder Industrial Energy System Sections | ||||||||
| Tom Van Acker, Dirk Van Hertem | IEEE Transactions on Reliability | 67 | 4 | 1459–1467 | 2018 | 13.41 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 664 | Reliability Analysis of Ethernet Ring Mesh Networks | ||||||||
| Fathollah Bistouni, Mohsen Jahanshahi | IEEE Transactions on Reliability | 66 | 4 | 1238–1252 | 2017 | 13.41 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 665 | Data-driven Prognostics with Predictive Uncertainty Estimation using Ensemble of Deep Ordinal Regression Models | ||||||||
| Vishnu TV, Diksha Chavan, Pankaj Malhotra, Lovekesh Vig, Gautam Shroff | International Journal of Prognostics and Health Management | 10 | 4 | 2612–None | 2019 | 13.4 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 666 | Metamodel-Based Directional Importance Sampling for Structural Reliability Analysis | ||||||||
| Nan Ye, Zhenzhou Lu, Xiaobo Zhang, Kaixuan Feng | IEEE Transactions on Reliability | 73 | 1 | 463–477 | 2024 | 13.39 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 667 | Sparse and Flexible Convex-Hull Representation for Machine Degradation Modeling | ||||||||
| Tongtong Yan, Yuting Wang, Tangbin Xia, Bingchang Hou, Lifeng Xi, Dong Wang | IEEE Transactions on Reliability | 72 | 1 | 27–36 | 2023 | 13.39 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 668 | Degradation Modeling With Long-Term Memory Considering Measurement Errors | ||||||||
| Yunfei Shao, Wujun Si | IEEE Transactions on Reliability | 72 | 1 | 177–189 | 2023 | 13.39 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 669 | The Performance Analysis of Time Series Data Augmentation Technology for Small Sample Communication Device Recognition | ||||||||
| Zhuoran Cai, Wenxuan Ma, Xinrui Wang, Hanhong Wang, Zhongming Feng | IEEE Transactions on Reliability | 72 | 2 | 574–585 | 2023 | 13.39 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 670 | Utilizing Parity Checking to Optimize Soft Error Detection Through Low-Level Reexecution | ||||||||
| Brent De Blaere, Jens Vankeirsbilck, Jeroen Boydens | IEEE Transactions on Reliability | 72 | 4 | 1355–1366 | 2023 | 13.39 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||