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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
661 Ridge and Lasso Regression Models for Cross-Version Defect Prediction
Xiaoxing Yang, Wushao Wen IEEE Transactions on Reliability 67 3 885–896 2018 10.57
平均評価: / 5 ( 件のレビュー)
662 Selection of Acceleration Models for Test Planning and Model Usage
Frank Jakob, Martin Kimmelmann, Bernd Bertsche IEEE Transactions on Reliability 66 2 298–308 2017 10.57
平均評価: / 5 ( 件のレビュー)
663 Modeling and Estimation for Degradation Data With Initiation-Growth Correlations
Wenhui Wu, Bing Xing Wang, Piao Chen IEEE Transactions on Reliability 75 1 1377–1391 2026 10.52
平均評価: / 5 ( 件のレビュー)
664 Methodology for Accelerated Spalling Evolution Testing of Aeroengine Main Bearings
Zhiming Deng, Tudi Huang, Hong-Zhong Huang, Chuanlai Lu, Ziwei Xu, Mohammad Yazdi IEEE Transactions on Reliability 75 1 916–930 2026 10.52
平均評価: / 5 ( 件のレビュー)
665 Investigation of Bonds Between Network Convolution and Time-Frequency Transforms for Ex-Ante Interpretable Machine Health Prognosis
Yudong Cao, Junxian Shen, Jichao Zhuang, Xiaoli Zhao, Xiaoan Yan IEEE Transactions on Reliability 75 1 490–503 2026 10.5
平均評価: / 5 ( 件のレビュー)
666 A Cluster-Based Client Selection Model for Federated Learning With Heterogeneous Clients
Wanjing Zhao, Yunpeng Xiao, Haonan Mo, Qian Li, Tun Li, Guoyin Wang IEEE Transactions on Reliability 75 1 779–790 2026 10.49
平均評価: / 5 ( 件のレビュー)
667 Zero-Shot Fault Diagnosis in Manufacturing Processes via Attribute Co-Occurrence Relationships
Wei Dai, Boyang Zhao, Yun Lin, Qinglin Zheng, Yazhou Li IEEE Transactions on Reliability 75 1 977–990 2026 10.45
平均評価: / 5 ( 件のレビュー)
668 Modeling and Verification of MRSCAN Based on MapReduce Framework
Zhengkang Zuo, Yuhan Ke, Ying Hu, Qing Huang, Zhicheng Zeng, Changjing Wang IEEE Transactions on Reliability 74 3 3311–3325 2025 10.43
平均評価: / 5 ( 件のレビュー)
669 DA-FL: Blockchain Empowered Secure and Private Federated Learning With Anonymous Authentication
Hu Xiong, Yaxin Zhao, Ye Xia, Min Zhang, Kuo-Hui Yeh IEEE Transactions on Reliability 74 4 5133–5146 2025 10.36
平均評価: / 5 ( 件のレビュー)
670 Transformation-Recipe-Based FPGA Synthesis Compiler Testing
Yi Zhang, He Jiang, Shikai Guo, Xiaochen Li, Zun Wang, Shuai Zhang, Wei Xu IEEE Transactions on Reliability 75 1 1064–1078 2026 10.35
平均評価: / 5 ( 件のレビュー)