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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
551 Generic Framework for Integration of First Prediction Time Detection With Machine Degradation Modelling from Frequency Domain
Tongtong Yan, Dong Wang, Bingchang Hou, Zhike Peng IEEE Transactions on Reliability 71 4 1464–1476 2022 14.2
平均評価: / 5 ( 件のレビュー)
552 Stress Testing With Influencing Factors to Accelerate Data Race Software Failures
Editorial IEEE Transactions on Reliability 69 1 3–21 2020 14.2
平均評価: / 5 ( 件のレビュー)
553 Active Labeling Aided Semi-Supervised Safety Assessment With Task-Related Unknown Scenarios
Chang Liu, Xiao He, Minyue Li, Yi Zhang, Zhongjun Ding IEEE Transactions on Reliability 73 4 1792–1804 2024 14.18
平均評価: / 5 ( 件のレビュー)
554 Fault-Tolerant Multiplayer Tracking Control for Autonomous Vehicle via Model-Free Adaptive Dynamic Programming
Huihui Pan, Chi Zhang, Weichao Sun IEEE Transactions on Reliability 72 4 1395–1406 2023 14.18
平均評価: / 5 ( 件のレビュー)
555 Java Code Clone Detection by Exploiting Semantic and Syntax Information From Intermediate Code-Based Graph
Dawei Yuan, Sen Fang, Tao Zhang, Zhou Xu, Xiapu Luo IEEE Transactions on Reliability 72 2 511–526 2023 14.18
平均評価: / 5 ( 件のレビュー)
556 A Novel FMEA-Based Approach to Risk Analysis of Product Design Using Extended Choquet Integral
Jing Zhou, Yu Liu, Tangfan Xiahou, Tudi Huang IEEE Transactions on Reliability 71 3 1264–1280 2022 14.18
平均評価: / 5 ( 件のレビュー)
557 Reliability Estimation of k-out-of-n Pairs:G Balanced Systems With Spatially Distributed Units
Dingguo Hua, Elsayed A. Elsayed IEEE Transactions on Reliability 65 2 886–900 2016 14.18
平均評価: / 5 ( 件のレビュー)
558 Proximal Gauss-Newton Method for Box-constrained Parameter Identification of a Nonlinear Railway Suspension System
Kristian Bredies, Enis Chenchene, Josef Fuchs, Bernd Luber International Journal of Prognostics and Health Management 15 2 3919–None 2024 14.16
平均評価: / 5 ( 件のレビュー)
559 DeepRepair: Style-Guided Repairing for Deep Neural Networks in the Real-World Operational Environment
Bing Yu, Hua Qi, Qing Guo, Felix Juefei-Xu, Xiaofei Xie, Lei Ma, Jianjun Zhao IEEE Transactions on Reliability 71 4 1401–1416 2022 14.16
平均評価: / 5 ( 件のレビュー)
560 Statistical Models of Overdispersed Spatial Defects for Predicting the Yield of Integrated Circuits
Tao Yuan, Suk Joo Bae, Yue Kuo IEEE Transactions on Reliability 69 2 510–521 2020 14.16
平均評価: / 5 ( 件のレビュー)