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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
521 Studying Aging-Related Bug Prediction Using Cross-Project Models
Fangyun Qin, Zheng Zheng, Yu Qiao, Kishor S. Trivedi IEEE Transactions on Reliability 68 3 1134–1153 2019 14.27
平均評価: / 5 ( 件のレビュー)
522 Effects of Obesity and Fall Risk on Gait and Posture of Community- Dwelling Older Adults
Thurmon E. Lockhart, Christopher W. Frames, Rahul Soangra, Abraham Lieberman International Journal of Prognostics and Health Management 10 1 2750–None 2019 14.27
平均評価: / 5 ( 件のレビュー)
523 A Generalized Age Replacement Policy for Systems Under Renewing Repair-Replacement Warranty
Minjae Park, Ki Mun Jung, Dong Ho Park IEEE Transactions on Reliability 65 2 604–612 2016 14.27
平均評価: / 5 ( 件のレビュー)
524 Adversarial Domain Generalization Defense via Task-Relevant Feature Alignment in Cyber-Physical Systems
Sicheng Zhang, Jie Liu, Zhida Bao, Yandie Yang, Meiyu Wang, Yun Lin IEEE Transactions on Reliability 74 2 2515–2528 2025 14.25
平均評価: / 5 ( 件のレビュー)
525 Erratum to “Effective Prediction of Bug-Fixing Priority via Weighted Graph Convolutional Networks”
Sen Fang, You-shuai Tan, Tao Zhang, Zhou Xu, Hui Liu IEEE Transactions on Reliability 73 4 1994–1994 2024 14.25
平均評価: / 5 ( 件のレビュー)
526 Measurement and Evaluation for Prognostics and Health Management (PHM) for Manufacturing Operations – Summary of an Interactive Workshop Highlighting PHM Trends
Brian Weiss, Michael Brundage International Journal of Prognostics and Health Management 12 1 2653–None 2021 14.25
平均評価: / 5 ( 件のレビュー)
527 Patient-Specific Readmission Prediction and Intervention for Health Care
Yan Zhang International Journal of Prognostics and Health Management 10 3 2626–None 2019 14.25
平均評価: / 5 ( 件のレビュー)
528 On the Marshall–Olkin Copula Model for Network Reliability Under Dependent Failures
Omar Matus, Javiera Barrera, Eduardo Moreno, Gerardo Rubino IEEE Transactions on Reliability 68 2 451–461 2019 14.25
平均評価: / 5 ( 件のレビュー)
529 A General Stochastic Degradation Modeling Approach for Prognostics of Degrading Systems With Surviving and Uncertain Measurements
Xiaosheng Si, Tianmei Li, Qi Zhang IEEE Transactions on Reliability 68 3 1080–1100 2019 14.25
平均評価: / 5 ( 件のレビュー)
530 The Impact of Soft Error Event Topography on the Reliability of Computer Memories
Christopher Ogden, Michael Mascagni IEEE Transactions on Reliability 66 4 966–979 2017 14.25
平均評価: / 5 ( 件のレビュー)