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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
411 Relative Ageing of Series and Parallel Systems With Statistically Independent and Heterogeneous Component Lifetimes
Chen Li, Xiaohu Li IEEE Transactions on Reliability 65 2 1014–1021 2016 11.73
平均評価: / 5 ( 件のレビュー)
412 Editorial Ensuring Reliability, Security, and Trust for Enterprises
Winston Shieh IEEE Transactions on Reliability 73 2 805–807 2024 11.71
平均評価: / 5 ( 件のレビュー)
413 Reliability of a Distributed Computing System With Performance Sharing
Hui Xiao, Kunxiang Yi, Rui Peng, Gang Kou IEEE Transactions on Reliability 71 4 1555–1566 2022 11.71
平均評価: / 5 ( 件のレビュー)
414 Placement Design for a Stacked Die Package With Reliable Wireless Connections
Tzu-Lun Yuan, Mong-Na Lo Huang, Yu-Jung Huang IEEE Transactions on Reliability 69 4 1230–1238 2020 11.71
平均評価: / 5 ( 件のレビュー)
415 Reliability Analysis for Disjoint Paths
Takeru Inoue IEEE Transactions on Reliability 68 3 985–998 2019 11.71
平均評価: / 5 ( 件のレビュー)
416 Condition Monitoring Technologies for Synthetic Fiber Ropes - a Review
Espen Oland, Rune Schlanbusch, Shaun Falconer International Journal of Prognostics and Health Management 8 2 2619–None 2017 11.71
平均評価: / 5 ( 件のレビュー)
417 IAMM: A Maturity Model for Measuring Industrial Analytics Capabilities in Large-scale Manufacturing Facilities
Peter O’Donovan, Ken Bruton, Dominic T.J. O’Sullivan International Journal of Prognostics and Health Management 7 4 2466–None 2016 11.71
平均評価: / 5 ( 件のレビュー)
418 Toward Improved Reliability of Deep Learning Based Systems Through Online Relabeling of Potential Adversarial Attacks
Shawqi Al-Maliki, Faissal El Bouanani, Kashif Ahmad, Mohamed Abdallah, Dinh Thai Hoang, Dusit Niyato, Ala Al-Fuqaha IEEE Transactions on Reliability 72 4 1367–1382 2023 11.69
平均評価: / 5 ( 件のレビュー)
419 Dependability Analysis of a System Using State-Space Modeling Techniques: A Systematic Review
Kumar Gaurav, Vinay Kumar, Binod Kumar Singh IEEE Transactions on Reliability 72 4 1340–1354 2023 11.69
平均評価: / 5 ( 件のレビュー)
420 Guest Editorial: A Retrospective of Special Sections on Software Testing and Program Analysis
T. H. Tse, Yves Le Traon, Zhenyu Chen IEEE Transactions on Reliability 70 2 443–445 2021 11.69
平均評価: / 5 ( 件のレビュー)