331
An Efficient Direct Algorithm for Computing the Reliability of a Multistate Flow Network Subject to Flow Loss
Xiu-Zhen Xu, Hao-Wei Li, Yi-Feng Niu
IEEE Transactions on Reliability
75
1
1050–1063
2026
15.9
平均評価: / 5
( 件のレビュー)
332
TSV Built-In Self-Repair Architecture for Lifespan Reliability Enhancement of HBM
Donghyun Han, Duyeon Won, Sunghoon Kim, Sungho Kang
IEEE Transactions on Reliability
74
3
4143–4157
2025
15.89
平均評価: / 5
( 件のレビュー)
333
Exploring Initiation-Growth Correlation in Accelerated Degradation Testing Data: Both Classical and Bayesian Approaches
Guanqi Fang, Rong Pan, Yizi Wang, Haili He, Weiqin Yu
IEEE Transactions on Reliability
74
3
4348–4360
2025
15.87
平均評価: / 5
( 件のレビュー)
334
Iterative Regression Algorithm for Parameter Estimation for Nondestructive One-Shot Devices Under Cyclic Accelerated Life Test With Adaptive Proportion of Failure Design
Wenhan Zhang, Xiaojun Zhu, Mu He, Narayanaswamy Balakrishnan
IEEE Transactions on Reliability
74
4
4692–4703
2025
15.84
平均評価: / 5
( 件のレビュー)
335
New Design of Reliable Passive Filter for Harmonic Mitigation Using Secretary Bird Optimization Considering Power System Uncertainty
Mahmoud Elsisi, Jin-Ting Yu, Chun-Lien Su
IEEE Transactions on Reliability
74
4
4650–4661
2025
15.82
平均評価: / 5
( 件のレビュー)
336
Reliability Modeling and Assessment of Internet-of-Things in Smart Manufacturing Systems: A Modular Petri Net Approach
Qin Zhang, Yu Liu, Liudong Xing, Hong-Zhong Huang
IEEE Transactions on Reliability
74
4
4791–4805
2025
15.82
平均評価: / 5
( 件のレビュー)
337
Cumulative Damage Simulation and Self-Learning Response Surface-Based Nonintrusive Online Monitoring of Random Wear Degradation for Shaft Products
Bo Sun, Leyang Zhou, Zeyu Wu, Yeli Zhou, Qiang Feng, Junlin Pan, Tongshu Lin, Jiayu Hu, Mingyong Li, Jian Gao
IEEE Transactions on Reliability
75
1
2587–2599
2026
15.78
平均評価: / 5
( 件のレビュー)
338
SOFAN: Side-Channel Oriented Fingerprinting and Neutralization for TVM-Compiled DNNs
Minghui Li, Yang Li, Changchun Yin, Mingwei Li, Liming Fang
IEEE Transactions on Reliability
75
1
1118–1132
2026
15.75
平均評価: / 5
( 件のレビュー)
339
Reliability Analysis of Cyclic Accelerated Life Test Data Using Log-Location-Scale Family of Distributions Under Censoring With Application to Solder Joint Data
Wenhan Zhang, Xiaojun Zhu, Mu He, Narayanaswamy Balakrishnan
IEEE Transactions on Reliability
74
3
3043–3055
2025
15.75
平均評価: / 5
( 件のレビュー)
340
Optimal Designs of Multiple Step-Stress Accelerated Life Tests for One-Shot Devices With Weibull Lifetime Distributions
Man Ho Ling
IEEE Transactions on Reliability
74
3
3017–3027
2025
15.74
平均評価: / 5
( 件のレビュー)