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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
291 Importance Inference of Optimal Test Planning for Degradation Analysis
Yi-Shian Dong, Chien-Yu Peng IEEE Transactions on Reliability 74 3 4426–4440 2025 12.96
平均評価: / 5 ( 件のレビュー)
292 RDGV: Reputation-Driven Gradual Verification for Tampering Localization in Cooperative Task Offloading
Zhihui Zhao, Yuan Jin, Siyan Zhu, Dan Yu, Hongsong Zhu, Yongle Chen IEEE Transactions on Reliability 74 4 5160–5174 2025 12.96
平均評価: / 5 ( 件のレビュー)
293 Neurofuzzy Model Optimized for Integrating Explainability in the Prediction of Engine Performance Losses
Marcela Djoukouo, Virginie Tjahe Agnes, Morgin Carlos Feudjio Nguefack, Blaise Eugène Mtopi Fotso International Journal of Prognostics and Health Management 17 1 4730–None 2026 12.86
平均評価: / 5 ( 件のレビュー)
294 A Prediction Model of Malicious Information Dissemination Based on User Behavior Analysis
Tun Li, Weidong Ma, Ruicao Niu, Jiaxu Bian, Yunpeng Xiao IEEE Transactions on Reliability 74 4 4460–4472 2025 12.85
平均評価: / 5 ( 件のレビュー)
295 Evaluating and Improving Adversarial Robustness of Deep Learning Models for Intelligent Vehicle Safety
Manzoor Hussain, Jang-Eui Hong IEEE Transactions on Reliability 74 4 4559–4573 2025 12.84
平均評価: / 5 ( 件のレビュー)
296 Failure Mode and Effect Analysis for Machine Tool Risk Analysis Using Extended Gained and Lost Dominance Score Method
Wei-Zhong Wang, Xin-Wang Liu, Shu-Li Liu IEEE Transactions on Reliability 69 3 954–967 2020 12.82
平均評価: / 5 ( 件のレビュー)
297 Iterative Controller Synthesis for Multirobot System
Hao Shi, Rui Li, Wanwei Liu, Wei Dong, Ge Zhou IEEE Transactions on Reliability 69 3 851–862 2020 12.82
平均評価: / 5 ( 件のレビュー)
298 Assessment of Performance Reliability Degradation and Prediction of RUL Based on the Performance- Requirements Model Using Complementary Neural Networks and Dynamic Weighting
Jalaleddin Nezamipour, M. R. M. Aliha, Mohammad Reza Mohammadi IEEE Transactions on Reliability 75 1 1857–1868 2026 12.79
平均評価: / 5 ( 件のレビュー)
299 Deep Variational Autoencoder Classifier for Intelligent Fault Diagnosis Adaptive to Unseen Fault Categories
Anqi He, Xiaoning Jin IEEE Transactions on Reliability 70 4 1581–1595 2021 12.79
平均評価: / 5 ( 件のレビュー)
300 Robust Inference for One-Shot Device Testing Data Under Weibull Lifetime Model
Narayanaswamy Balakrishnan, Elena Castilla, Nirian Martín, Leandro Pardo IEEE Transactions on Reliability 69 3 937–953 2020 12.79
平均評価: / 5 ( 件のレビュー)