Powered by Engineering Brain, Japan | What is PKV? | PKV Methodology | KnowledgeRank v4.0.0: PKV Trends of My Authored Papers Are Now Available on My Page

アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
271 Decentralized Event-Driven Reliability Control Using Reinforcement Learning: A Homomorphic Encryption Scheme
Jian Liu, Shuailong Wang, Jinliang Liu, Engang Tian, Chen Peng IEEE Transactions on Reliability 75 1 570–580 2026 13.29
平均評価: / 5 ( 件のレビュー)
272 Multisource Deep Adversarial Decoupled Autoencoder Network for State Recognition of High-Speed Train Brake Pads
Min Zhang, Jiamin Li, Zhuang Kang, Tong Lan, Haohao Ding IEEE Transactions on Reliability 75 1 639–649 2026 13.28
平均評価: / 5 ( 件のレビュー)
273 Calculation and Analysis of Temperature Fields for Critical Stator and Rotor Components Under Control System Faults in Large-Capacity Offshore Wind Generator
Xiaoke Liu, Junci Cao, Peng Zuo, Weili Li IEEE Transactions on Reliability 75 1 273–282 2026 13.28
平均評価: / 5 ( 件のレビュー)
274 Physics-Enhanced NMF Toward Anomaly Detection in Rotating Mechanical Systems
Bingxin Yan, Xiaobing Ma, Qiuzhuang Sun, Lijuan Shen IEEE Transactions on Reliability 74 3 3911–3925 2025 13.22
平均評価: / 5 ( 件のレビュー)
275 Toward Adaptive Meta-Gradient Adversarial Examples for Visual Tracking
Wei-Long Tian, Peng Gao, Xiao Liu, Long Xu, Hamido Fujita, Hanan Aljuaid, Mao-Li Wang IEEE Transactions on Reliability 74 4 5205–5218 2025 13.17
平均評価: / 5 ( 件のレビュー)
276 Network Reliability Estimation of Multicapacity Networks for Various Demand Levels Using Monte Carlo and Linear Programming
Ding-Hsiang Huang IEEE Transactions on Reliability 74 4 5371–5380 2025 13.15
平均評価: / 5 ( 件のレビュー)
277 Enhancing Java Web Application Security: Injection Vulnerability Detection via Interprocedural Analysis and Deep Learning
Bing Zhang, Xu Zhi, Meng Wang, Rong Ren, Jun Dong IEEE Transactions on Reliability 74 3 3642–3656 2025 13.14
平均評価: / 5 ( 件のレビュー)
278 A Review of Prognostics Methods for Electronic Packages: From a Structure-Aware System-Level Perspective
Zihan Zhang, Alina Gorbunova, Keunho Rhew, Jianjun Shi IEEE Transactions on Reliability 74 3 4116–4130 2025 13.13
平均評価: / 5 ( 件のレビュー)
279 Robust Statistical Inference for Accelerated Life-Tests With One-Shot Devices Under Log-Logistic Distributions
María González-Calderón, María Jaenada, Leandro Pardo IEEE Transactions on Reliability 75 1 954–968 2026 13.12
平均評価: / 5 ( 件のレビュー)
280 Unsupervised Software Defect Prediction Through Multiview Clustering
Zhiqiang Li, Hongyu Zhang, Xiao-Yuan Jing, Wangyang Yu, Yueyue Liu IEEE Transactions on Reliability 74 3 3356–3370 2025 13.11
平均評価: / 5 ( 件のレビュー)