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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
2641 A framework for improving the efficiency of operational testing through Bayesian adaptive design
Victoria R.C. Sieck, Fletcher G.W. Christensen Quality and Reliability Engineering International 37 7 3018–3033 2020 5.0
平均評価: / 5 ( 件のレビュー)
2642 An adaptive EWMA control chart for monitoring the process mean in Bayesian theory under different loss functions
Muhammad Noor‐ul‐Amin, Surria Noor Quality and Reliability Engineering International 37 2 804–819 2020 5.0
平均評価: / 5 ( 件のレビュー)
2643 Mixed-input Gaussian process emulators for computer experiments with a large number of categorical levels
Qiong Zhang, Peter Chien, Qing Liu, Li Xu, Yili Hong Journal of Quality Technology 53 4 410–420 2020 5.0
平均評価: / 5 ( 件のレビュー)
2644 Chaotic neural network model for SMISs reliability prediction based on interdependent network SMISs reliability prediction by chaotic neural network
Jianhua Zhu, Zhuping Gong, Yanming Sun, Zixin Dou Quality and Reliability Engineering International 37 2 717–742 2020 5.0
平均評価: / 5 ( 件のレビュー)
2645 New reliability modeling methods for structural systems with hybrid uncertainty
Yongsheng Zhao, Hongchao Wu, Congbin Yang, Zhifeng Liu, Qiang Cheng Quality and Reliability Engineering International 36 6 1855–1871 2020 5.0
平均評価: / 5 ( 件のレビュー)
2646 Planning constant‐stress accelerated life tests with multiple stresses based on D‐optimal design
Xiangxiang Zhang, Jun Yang, Xuefeng Kong Quality and Reliability Engineering International 37 1 60–77 2020 5.0
平均評価: / 5 ( 件のレビュー)
2647 Formulation of A Risk Assessment Framework Capable of Analyzing Nuclear Power Multiunit Accident Scenarios
Yinan Cai, Michael W. Golay Reliability Engineering & System Safety 202 None 107040–None 2020 5.0
平均評価: / 5 ( 件のレビュー)
2648 A new exponentially weighted moving average chart with an adaptive control scheme for high yield processes—An application in injection molding process
Sani Salihu Abubakar, Michael B.C. Khoo, Sajal Saha, Ming Ha Lee Quality and Reliability Engineering International 37 2 527–540 2020 5.0
平均評価: / 5 ( 件のレビュー)
2649 Robust inference for one‐shot device testing data under exponential lifetime model with multiple stresses
Narayanaswamy Balakrishnan, Elena Castilla, Nirian Martín, Leandro Pardo Quality and Reliability Engineering International 36 6 1916–1930 2020 5.0
平均評価: / 5 ( 件のレビュー)
2650 Self‐information‐based weighted CUSUM charts for monitoring Poisson count data with varying sample sizes
Yang Zhang, Yanfen Shang, An‐Da Li Quality and Reliability Engineering International 37 5 1847–1862 2020 5.0
平均評価: / 5 ( 件のレビュー)