アクセスランキング（PKV）
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Jubilee Review: The 65 Years of the ASME Machine Design Award (1958–2023)
| 順位 | タイトル | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 雑誌 | 巻 | 号 | ページ | 年 | PKVアクセス数 | |||
| 231 | A Fuzzy-FMEA Risk Assessment Approach for Offshore Wind Turbines | ||||||||
| F. Dinmohammadi, M. Shafiee | International Journal of Prognostics and Health Management | 4 | 3 | 2143–None | 2013 | 16.95 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 232 | Ensemble Kernel-Mapping-Based Ranking Support Vector Machine for Software Defect Prediction | ||||||||
| Zhanyu Yang, Lu Lu, Quanyi Zou | IEEE Transactions on Reliability | 73 | 1 | 664–679 | 2024 | 16.93 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 233 | An Extended Kriging Model-Based Method for Efficient Reliability Analysis Under Parametric Variation of Probability Distribution | ||||||||
| Junxiang Li, Zhipeng Dong, Xinxin Zhang, Moran Xu, Longchao Cao | IEEE Transactions on Reliability | 75 | 1 | 765–778 | 2026 | 16.88 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 234 | An MLS-AK-MCS Framework for Reliability-Based Design Optimization of Rolling Contact Connector | ||||||||
| Nianhuan Li, Haihong Wu, Junye Li, Zili Liu, Jianhe Liu, Xin Du | IEEE Transactions on Reliability | 75 | 1 | 283–295 | 2026 | 16.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 235 | MFSFormer: A Novel End-to-End Rotating Machinery Fault Diagnosis Framework for Noise and Small Samples | ||||||||
| Xueyi Li, Sixin Li, Jinfeng Huang, Feibin Zhang, Xiangwei Kong, Zhijie Xie, Fulei Chu | IEEE Transactions on Reliability | 74 | 3 | 4158–4169 | 2025 | 16.82 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 236 | Multi-State Reliability Modeling and Analysis for More Electric Aircraft Electrical Power System Considering State Transition Uncertainty | ||||||||
| Xinhao Cheng, Jiayu Chen, Hongjuan Ge, Peng Li, Yinxiao Hu | IEEE Transactions on Reliability | 75 | 1 | 931–942 | 2026 | 16.77 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 237 | Application of Embedded Stress Sensors for Third-Generation Reliability of Electronic Systems: Validation and Calibration of Mechanical Models in Fan-Out Wafer-Level Packaging | ||||||||
| Yuexing Wang, Linwei Cao, Xu He, Kun Liu, Shuairong Deng, Quanfeng Zhou, Xiangyu Sun, Yao Yao | IEEE Transactions on Reliability | 74 | 4 | 4604–4613 | 2025 | 16.69 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 238 | A Review of Prognostics Methods for Electronic Packages: From a Structure-Aware System-Level Perspective | ||||||||
| Zihan Zhang, Alina Gorbunova, Keunho Rhew, Jianjun Shi | IEEE Transactions on Reliability | 74 | 3 | 4116–4130 | 2025 | 16.68 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 239 | FSRS: A Frequency Space Random Search Approach for Efficient Opaque-Box Adversarial Attacks | ||||||||
| Min Han Tsai, Qi Xian Huang, Hung Min Sun | IEEE Transactions on Reliability | 74 | 4 | 4488–4498 | 2025 | 16.68 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 240 | Development and Practical Advances in Integrated Circuit Electromagnetic Reliability Over the Last Decade | ||||||||
| Ledong Chen, Jianfei Wu, Honghai Liu, Fukang Niu, Linxi Huang, Pingyun Jiang, Jibin Liu | IEEE Transactions on Reliability | 75 | 1 | 819–832 | 2026 | 16.67 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||