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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
2281 A Generic Framework for Generalized Virtual Age Models
Laurent Doyen, Rémy Drouilhet, Léa Brenière IEEE Transactions on Reliability 69 2 816–832 2020 5.71
平均評価: / 5 ( 件のレビュー)
2282 Quantification of Dynamic Flexibility Provided by District Heating Networks for Electric Power System
Yujia Huang, Qiuye Sun, Yiping Ren, Rui Wang, Zhe Chen IEEE Transactions on Reliability 74 2 2904–2915 2025 5.7
平均評価: / 5 ( 件のレビュー)
2283 Challenges of Assured Autonomy
D. Richard Kuhn IEEE Transactions on Reliability 73 1 73–82 2024 5.7
平均評価: / 5 ( 件のレビュー)
2284 Neural Network Enabled Intermittent Fault Diagnosis Under Comparison Model
Limei Lin, Shuming Zhou, Sun-Yuan Hsieh IEEE Transactions on Reliability 72 3 1206–1219 2023 5.7
平均評価: / 5 ( 件のレビュー)
2285 Imperfect Debugging Software Belief Reliability Growth Model Based on Uncertain Differential Equation
Zhe Liu, Rui Kang IEEE Transactions on Reliability 71 2 735–746 2022 5.7
平均評価: / 5 ( 件のレビュー)
2286 3-D Printed Object Authentication Based on Printing Noise and Digital Signature
Fei Peng, Jing Yang, Min Long IEEE Transactions on Reliability 68 1 342–353 2019 5.7
平均評価: / 5 ( 件のレビュー)
2287 A Novel Active-Learning Kriging Reliability Analysis Method Based on Parallelized Sampling Considering Budget Allocation
Yushuai Che, Yan Ma, Yongxiang Li, Linhan Ouyang IEEE Transactions on Reliability 73 1 589–601 2024 5.69
平均評価: / 5 ( 件のレビュー)
2288 Biobjective Maintenance Strategy Optimization for Complex Multistate Systems Based on PH Distribution
Huixian Zhang, Xiukun Wei, Yaning Ding, Jing Li IEEE Transactions on Reliability 73 3 1693–1707 2024 5.69
平均評価: / 5 ( 件のレビュー)
2289 Epistemic Uncertainty Propagation and Reliability Evaluation of Feedback Control System
Ying Chen, Yanfang Wang, Rui Kang IEEE Transactions on Reliability 73 1 521–535 2024 5.69
平均評価: / 5 ( 件のレビュー)
2290 Vulnerabilities and Reliability of ReRAM Based PUFs and Memory Logic
Thomas Schultz, Rashmi Jha, Matt Casto, Brian Dupaix IEEE Transactions on Reliability 69 2 690–698 2020 5.69
平均評価: / 5 ( 件のレビュー)