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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
191 ECC-Based Lightweight Authentication for Resource-Constrained Devices Leveraging the Edge Node
Mitrup Kabi, Neelam Dayal, Pushpa Raikwal IEEE Transactions on Reliability 74 2 2605–2612 2025 14.53
平均評価: / 5 ( 件のレビュー)
192 Random Effect Additive Mean Residual Life Model
M. Kayid, S. Izadkhah, D. ALmufarrej IEEE Transactions on Reliability 65 2 860–866 2016 14.53
平均評価: / 5 ( 件のレビュー)
193 Reliability Modeling and Prediction of Systems With Mixture of Units
Yao Cheng, E. A. Elsayed IEEE Transactions on Reliability 65 2 914–928 2016 14.52
平均評価: / 5 ( 件のレビュー)
194 A Fault- Tolerant DC-DC Converter with Zero Interruption Time Using Capacitor Health Prognosis
Preethi Sharma K, Vijayakumar T International Journal of Prognostics and Health Management 14 2 3545–None 2023 14.5
平均評価: / 5 ( 件のレビュー)
195 Improved Heat Exchanger Lifecycle Prognostic Methods for Enhanced Light Water Reactor Sustainability
Zachary Welz, Alan Nam, Michael Sharp, J. Wesley Hines, Belle R. Upadhyaya International Journal of Prognostics and Health Management 6 3 2283–None 2015 14.5
平均評価: / 5 ( 件のレビュー)
196 An Efficient Direct Algorithm for Computing the Reliability of a Multistate Flow Network Subject to Flow Loss
Xiu-Zhen Xu, Hao-Wei Li, Yi-Feng Niu IEEE Transactions on Reliability 75 1 1050–1063 2026 14.42
平均評価: / 5 ( 件のレビュー)
197 Task-Oriented Reliability Modeling and Analysis of Federated Learning-Enabled Intelligent Manufacturing Systems
Xiaoluoteng Song, Xiuwen Fu, Liudong Xing, Rui Peng IEEE Transactions on Reliability 75 1 296–309 2026 14.37
平均評価: / 5 ( 件のレビュー)
198 An Extended Kriging Model-Based Method for Efficient Reliability Analysis Under Parametric Variation of Probability Distribution
Junxiang Li, Zhipeng Dong, Xinxin Zhang, Moran Xu, Longchao Cao IEEE Transactions on Reliability 75 1 765–778 2026 14.31
平均評価: / 5 ( 件のレビュー)
199 COSTAR: Software Code Smell Detection Through Tree-Based Abstract Representation
Praveen Singh Thakur, Mahipal Jadeja, Satyendra Singh Chouhan, Santosh Singh Rathore IEEE Transactions on Reliability 75 1 581–595 2026 14.29
平均評価: / 5 ( 件のレビュー)
200 Precise 3-D Temperature Field Reconstruction of Automotive Aluminum Forging Dies Using Deep Learning and Heterogeneous Multiview Vision
Yongshuo She, Zeqi Hu, Hongwei Qi, Rui Song, Lin Hua, Yudong Chen IEEE Transactions on Reliability 75 1 1365–1376 2026 14.23
平均評価: / 5 ( 件のレビュー)