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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
181 Enhancing Java Web Application Security: Injection Vulnerability Detection via Interprocedural Analysis and Deep Learning
Bing Zhang, Xu Zhi, Meng Wang, Rong Ren, Jun Dong IEEE Transactions on Reliability 74 3 3642–3656 2025 17.7
平均評価: / 5 ( 件のレビュー)
182 Identification of Deletion Attacks in Discrete-Event Systems Through Petri Nets Enhanced With an Observation Structure
Adeeb A. Ahmed, Yufeng Chen, Ding Liu, Zhiwu Li IEEE Transactions on Reliability 75 1 833–847 2026 17.59
平均評価: / 5 ( 件のレビュー)
183 Learning to Accelerate Autonomous Driving System Testing
Haibo Wang, Zhide Zhou, Xiaochen Li, Shikai Guo, He Jiang IEEE Transactions on Reliability 74 4 4589–4603 2025 17.58
平均評価: / 5 ( 件のレビュー)
184 Importance Inference of Optimal Test Planning for Degradation Analysis
Yi-Shian Dong, Chien-Yu Peng IEEE Transactions on Reliability 74 3 4426–4440 2025 17.55
平均評価: / 5 ( 件のレビュー)
185 Assessing the Sustainability Impacts of Industry 4.0 on Maintenance Policies
Mouhamadou Mansour Diop, Christophe DANJOU, Amélie PONCHET DURUPT, Yacine BAOUCH, Nassim BOUDAOUD International Journal of Prognostics and Health Management 16 4 4267–None 2025 17.52
平均評価: / 5 ( 件のレビュー)
186 A Prediction Model of Malicious Information Dissemination Based on User Behavior Analysis
Tun Li, Weidong Ma, Ruicao Niu, Jiaxu Bian, Yunpeng Xiao IEEE Transactions on Reliability 74 4 4460–4472 2025 17.51
平均評価: / 5 ( 件のレビュー)
187 Query-Vector-Focused Recurrent Attention for Remaining Useful Life Prediction
Ye-In Park, Suk-Ju Kang IEEE Transactions on Reliability 74 4 5564–5578 2025 17.49
平均評価: / 5 ( 件のレビュー)
188 Bayesian Analysis of Accelerated Trend Renewal Processes With Application to Lithium-Ion Battery Data
Tsai-Hung Fan, Yi-Fu Wang, Chun-Kai Wu IEEE Transactions on Reliability 74 3 3083–3097 2025 17.47
平均評価: / 5 ( 件のレビュー)
189 Adaptive Random Testing of Deep Learning Systems Using Image Hashing
Linwei Yi, Chenhui Cui, Rubing Huang, Dave Towey, Rongcun Wang IEEE Transactions on Reliability 74 4 4985–4999 2025 17.44
平均評価: / 5 ( 件のレビュー)
190 Expanding and Obfuscating In-Cone Trees to Resist SAT Attack in Logic Locking
RuiJie Wang, Li-Nung Hsu, Yung-Chih Chen, TingTing Hwang IEEE Transactions on Reliability 74 4 4514–4528 2025 17.43
平均評価: / 5 ( 件のレビュー)