Powered by Engineering Brain, Japan | What is PKV? | PKV Methodology | KnowledgeRank v4.0.0: PKV Trends of My Authored Papers Are Now Available on My Page

アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
1881 Performance-Driven Metamorphic Testing of Cyber-Physical Systems
Jon Ayerdi, Pablo Valle, Sergio Segura, Aitor Arrieta, Goiuria Sagardui, Maite Arratibel IEEE Transactions on Reliability 72 2 827–845 2023 2.83
平均評価: / 5 ( 件のレビュー)
1882 Verifying Properties of MapReduce-Based Big Data Processing
Nan Zhang, Meng Wang, Zhenhua Duan, Cong Tian IEEE Transactions on Reliability 71 1 321–338 2022 2.83
平均評価: / 5 ( 件のレビュー)
1883 Tracking Code Bug Fix Ripple Effects Based on Change Patterns Using Markov Chain Models
Ekincan Ufuktepe, Tugkan Tuglular, Kannappan Palaniappan IEEE Transactions on Reliability 71 2 1141–1156 2022 2.83
平均評価: / 5 ( 件のレビュー)
1884 An Unsupervised Software Fault Prediction Approach Using Threshold Derivation
Rakesh Kumar, Amrita Chaturvedi, Lakshmanan Kailasam IEEE Transactions on Reliability 71 2 911–932 2022 2.83
平均評価: / 5 ( 件のレビュー)
1885 Fractional Failures Sampling—An Alternative to Zero Failures Sampling Plans
Horst Lewitschnig, Armin Fanzott IEEE Transactions on Reliability 68 2 609–619 2019 2.83
平均評価: / 5 ( 件のレビュー)
1886 Distributionally Robust Reliability Assessment for Transmission System Hardening Plan Under N−k Security Criterion
Ali Bagheri, Chaoyue Zhao IEEE Transactions on Reliability 68 2 653–662 2019 2.83
平均評価: / 5 ( 件のレビュー)
1887 3-D Printed Object Authentication Based on Printing Noise and Digital Signature
Fei Peng, Jing Yang, Min Long IEEE Transactions on Reliability 68 1 342–353 2019 2.83
平均評価: / 5 ( 件のレビュー)
1888 The Inverse Nakagami-m Distribution: A Novel Approach in Reliability
Francisco Louzada, Pedro Luiz Ramos, Diego Nascimento IEEE Transactions on Reliability 67 3 1030–1042 2018 2.83
平均評価: / 5 ( 件のレビュー)
1889 Image-Quality-Guided Consistency-Alignment Network for Fault Diagnosis
Zhuowei Li, Jianxu Mao, Wenbin He, Yaonan Wang, Junfei Yi, Caiping Liu, Hui Zhang IEEE Transactions on Reliability 75 1 2117–2130 2026 2.0
平均評価: / 5 ( 件のレビュー)
1890 STFP-SNN: Spiking Time-Frequency Patching Spiking Neural Network for Enhanced Fault Diagnosis
Shilong Zhu, Jun Wang, Weiguo Huang, Shuang Li, Jinzhao Liu IEEE Transactions on Reliability 75 1 2486–2498 2026 2.0
平均評価: / 5 ( 件のレビュー)