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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
171 Physics Based Degradation Models for Electrolytic Capacitor Prognostics under Thermal Overstress Conditions
Chetan S. Kulkarni, Gautam Biswas, José R. Celaya, Kai Goebel International Journal of Prognostics and Health Management 4 1 1448–None 2013 17.97
平均評価: / 5 ( 件のレビュー)
172 An Unscented Kalman Filter Based on-line Diagnostic Approach For PEM Fuel Cell Flooding
Xian Zhang, Pierluigi Pisu International Journal of Prognostics and Health Management 5 1 2204–None 2014 17.95
平均評価: / 5 ( 件のレビュー)
173 Mission Abort Policy for Coherent Systems With Heterogeneous Components
Amin Karimi, Mahdi Tavangar, Maxim Finkelstein IEEE Transactions on Reliability 74 4 4704–4718 2025 17.91
平均評価: / 5 ( 件のレビュー)
174 A Quantile-Based Approach for Testing Exponentiality Against DMTTF Alternatives
Koushik Das, Shyamal Ghosh IEEE Transactions on Reliability 74 4 4626–4635 2025 17.87
平均評価: / 5 ( 件のレビュー)
175 COSTAR: Software Code Smell Detection Through Tree-Based Abstract Representation
Praveen Singh Thakur, Mahipal Jadeja, Satyendra Singh Chouhan, Santosh Singh Rathore IEEE Transactions on Reliability 75 1 581–595 2026 17.85
平均評価: / 5 ( 件のレビュー)
176 Multisource Deep Adversarial Decoupled Autoencoder Network for State Recognition of High-Speed Train Brake Pads
Min Zhang, Jiamin Li, Zhuang Kang, Tong Lan, Haohao Ding IEEE Transactions on Reliability 75 1 639–649 2026 17.82
平均評価: / 5 ( 件のレビュー)
177 A Two-Step Sub-Sampling Approach for a Computationally Efficient Particle Filter-Based Prognosis
Kevin Espinoza, Jorge García Bustos, Leonardo Baldo, Francisco Jaramillo-Montoya, David Acuña-Ureta, Marcos Orchard IEEE Transactions on Reliability 75 1 791–803 2026 17.76
平均評価: / 5 ( 件のレビュー)
178 Information Correction–Based Analytical Model for Fault Section Diagnosis of Power Systems
Guojiang Xiong, Shunshun Sun IEEE Transactions on Reliability 74 3 3847–3855 2025 17.76
平均評価: / 5 ( 件のレビュー)
179 Digital Twin-Enabled Smart Operation and Maintenance Framework With Generative AI Design of Intelligent Manufacturing Systems
Hongyan Dui, Hengbo Wang, Liudong Xing IEEE Transactions on Reliability 75 1 504–517 2026 17.72
平均評価: / 5 ( 件のレビュー)
180 Non-Arrhenius Degradation Model for Stress Relaxation in Electromagnetic Relay Using Accelerated Degradation Test
Rao Fu, Shenghui Zhou, Huafeng Xing, Yigang Lin IEEE Transactions on Reliability 74 3 4335–4347 2025 17.72
平均評価: / 5 ( 件のレビュー)