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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1731 Adaptive Output-Feedback Fault-Tolerant Control for Distributed Optimization of Nonlinear MASs Under Event-Triggered Communication
Yonglin Yu, Xudong Zhao, Ben Niu, Ding Wang, Xing Wang, Xinjun Wang IEEE Transactions on Reliability 75 1 2600–2613 2026 7.88
平均評価: / 5 ( 件のレビュー)
1732 An Adaptive Fault Diagnosis Scheme for the Augmented Cube-Based Data Center Networks
Xiao-Yan Li, Shihui Wei, Jou-Ming Chang, Genggeng Liu, Cheng-Kuan Lin IEEE Transactions on Reliability 75 1 2546–2559 2026 7.88
平均評価: / 5 ( 件のレビュー)
1733 Optimal Maintenance Service Strategy of Service-Oriented Aviation Manufacturers for Two-Stage Leased System Under Capacity Limits
Ying Zhu, Tangbin Xia, Yutong Ding, Ge Hong, Zhen Chen, Ershun Pan, Lifeng Xi IEEE Transactions on Reliability 73 2 1353–1367 2024 7.88
平均評価: / 5 ( 件のレビュー)
1734 Hephaestus: Modeling, Analysis, and Performance Evaluation of Cross-Chain Transactions
Rafael Belchior, Peter Somogyvari, Jonas Pfannschmidt, André Vasconcelos, Miguel Correia IEEE Transactions on Reliability 73 2 1132–1146 2024 7.88
平均評価: / 5 ( 件のレビュー)
1735 Noncontact Cross Domain Fault Diagnosis via Multisource Heterogeneous Data Fusion and Global Imbalance Awareness
Yanrun Zhou, Guangrui Wen, Zihao Lei, Yu Su, Zhenyi Chen, Qing Ni, Yongbo Li, Ke Feng IEEE Transactions on Reliability 75 1 2235–2246 2026 7.86
平均評価: / 5 ( 件のレビュー)
1736 Suppressing False Positives in Web Application Firewalls With Program Trace Anomaly Detection
Min-Chieh Wu, Yu-Wei Liao, Yu-Sung Wu IEEE Transactions on Reliability 75 1 2220–2234 2026 7.84
平均評価: / 5 ( 件のレビュー)
1737 Data-Driven Secure Control for UMVs Against False Data Injection Attacks Using GLU–GRU
Li-Ying Hao, Lin-Fan Liu, Huiying Liu IEEE Transactions on Reliability 75 1 2174–2187 2026 7.84
平均評価: / 5 ( 件のレビュー)
1738 Marvel: Effective AI-Enabled Cyber-Physical System Falsification Guided by Novelty Detection
Xuan Xie, Lei Ma IEEE Transactions on Reliability 75 1 2247–2259 2026 7.84
平均評価: / 5 ( 件のレビュー)
1739 A Transistor-Level Reliability Estimation of CNTFET-Based Multivalued Logic Circuits
Hadi Jahanirad IEEE Transactions on Reliability 75 1 2349–2363 2026 7.82
平均評価: / 5 ( 件のレビュー)
1740 AlignDC: A Scalable and Reliable Ranking Algorithm for Noisy Crowdsourced Pairwise Comparisons
Ming-Hung Wang, Han-Ping Wu, Yu-Yu Chang, Hsiu-Ling Chu, Wei-Bin Lee IEEE Transactions on Reliability 75 1 2319–2333 2026 7.8
平均評価: / 5 ( 件のレビュー)