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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
1711 Event Prediction for Individual Unit Based on Recurrent Event Data Collected in Teleservice Systems
Banghu Yin, Liqian Chen, Jiangchao Liu, Ji Wang IEEE Transactions on Reliability 69 1 216–227 2020 3.85
平均評価: / 5 ( 件のレビュー)
1712 A Moment Approach to Positioning Accuracy Reliability Analysis for Industrial Robots
Jinhui Wu, Dequan Zhang, Jie Liu, Xu Han IEEE Transactions on Reliability 69 2 699–714 2020 3.85
平均評価: / 5 ( 件のレビュー)
1713 Runtime Verification on Hierarchical Properties of ROS-Based Robot Swarms
Chi Hu, Wei Dong, Yonghui Yang, Hao Shi, Ge Zhou IEEE Transactions on Reliability 69 2 674–689 2020 3.85
平均評価: / 5 ( 件のレビュー)
1714 ART4SQLi: The ART of SQL Injection Vulnerability Discovery
Long Zhang, Donghong Zhang, Chenghong Wang, Jing Zhao, Zhenyu Zhang IEEE Transactions on Reliability 68 4 1470–1489 2019 3.85
平均評価: / 5 ( 件のレビュー)
1715 Optimum Periodic Component Reallocation and System Replacement Maintenance
Yuqiang Fu, Tao Yuan, Xiaoyan Zhu IEEE Transactions on Reliability 68 2 753–763 2019 3.85
平均評価: / 5 ( 件のレビュー)
1716 Selecting Suitable Candidates for Predictive Maintenance
W. W. Tiddens, A.J.J. Braaksma, T. Tinga International Journal of Prognostics and Health Management 9 1 2699–None 2018 3.85
平均評価: / 5 ( 件のレビュー)
1717 Degradation Modeling and Prediction of Ink Fading and Diffusion of Printed Images
Ziyi Wang, E. A. Elsayed IEEE Transactions on Reliability 67 1 184–195 2018 3.85
平均評価: / 5 ( 件のレビュー)
1718 An Optimal Condition-Based Replacement Method for Systems With Observed Degradation Signals
Xiaosheng Si, Tianmei Li, Qi Zhang, Xiaoxiang Hu IEEE Transactions on Reliability 67 3 1281–1293 2018 3.85
平均評価: / 5 ( 件のレビュー)
1719 Predictive Resilience Analysis of Complex Systems Using Dynamic Bayesian Networks
Nita Yodo, Pingfeng Wang, Zhi Zhou IEEE Transactions on Reliability 66 3 761–770 2017 3.85
平均評価: / 5 ( 件のレビュー)
1720 A Two-Stage Latent Variable Estimation Procedure for Time-Censored Accelerated Degradation Tests
Ming-Yung Lee, Cheng-Hung Hu, Jen Tang IEEE Transactions on Reliability 66 4 1266–1279 2017 3.85
平均評価: / 5 ( 件のレビュー)