Powered by Engineering Brain, Japan | What is PKV? | PKV Methodology | KnowledgeRank v4.0.0: PKV Trends of My Authored Papers Are Now Available on My Page

アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1691 To What Extent is Stress Testing of Android TV Applications Automated in Industrial Environments?
Bo Jiang, Peng Chen, Wing Kwong Chan, Xinchao Zhang IEEE Transactions on Reliability 65 3 1223–1239 2016 8.45
平均評価: / 5 ( 件のレビュー)
1692 Collective Personalized Change Classification With Multiobjective Search
Xin Xia, David Lo, Xinyu Wang, Xiaohu Yang IEEE Transactions on Reliability 65 4 1810–1829 2016 8.45
平均評価: / 5 ( 件のレビュー)
1693 SC-Chef: Turboboosting Smart Contract Concurrent Execution for High Contention Workloads via Chopping Transactions
Dibo Xian, Xuetao Wei IEEE Transactions on Reliability 73 1 216–229 2024 8.43
平均評価: / 5 ( 件のレビュー)
1694 Automatic Reliability Analysis in the Presence of Probabilistic Common Cause Failures
Faramarz Khosravi, Michael Glaß, Jürgen Teich IEEE Transactions on Reliability 66 2 319–338 2017 8.43
平均評価: / 5 ( 件のレビュー)
1695 An Adaptive Nonprobabilistic Convex Modeling Method Based on Cluster Analysis
Mingdong Wang, Gang Zhao, Liqing Chen, Jie Liu, Qi Yang IEEE Transactions on Reliability 75 1 1184–1197 2026 8.41
平均評価: / 5 ( 件のレビュー)
1696 ES-DLSSVM-Based Prognostics of Rolling Element Bearings
Yubo Shao, Xiao He, Bangcheng Zhang, Chao Cheng, Xiaopeng Xi IEEE Transactions on Reliability 73 1 317–327 2024 8.41
平均評価: / 5 ( 件のレビュー)
1697 Theory of Fokker–Planck Equations for Reliability and Remaining Useful Lifetime Prognostics
Thomas Christen, Felipe Macedo IEEE Transactions on Reliability 73 1 344–356 2024 8.37
平均評価: / 5 ( 件のレビュー)
1698 A Genetic Algorithm-Assisted Fault Detection Observer for Networked Systems Under Denial-of-Service Attacks
Peng Cheng, Shuping He, Weidong Zhang IEEE Transactions on Reliability 73 1 304–316 2024 8.35
平均評価: / 5 ( 件のレビュー)
1699 Applying Lexicographical Ordering to Software Product Line Testing
Tao Li, Chenhui Cui, Yinyin Xu, Rubing Huang IEEE Transactions on Reliability 74 3 3326–3340 2025 8.28
平均評価: / 5 ( 件のレビュー)
1700 Zero Forgetting Lifelong Dictionary Learning Based on Low-Rank Decomposition for Multimode Process Monitoring
Keke Huang, Zhongyu Zhang, Zixuan Chen, Dehao Wu, Chunhua Yang, Weihua Gui IEEE Transactions on Reliability 75 1 1198–1210 2026 8.25
平均評価: / 5 ( 件のレビュー)