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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1671 Data-driven approach for labelling process plant event data
Débora Corrêa, Adriano Polpo, Michael Small, Shreyas Srikanth, Kylie Hollins, Melinda Hodkiewicz International Journal of Prognostics and Health Management 13 1 3045–None 2022 8.5
平均評価: / 5 ( 件のレビュー)
1672 On Accelerated Life Testing When the AFT Model Fails
Vilijandas Bagdonavičius, Rūta Levulienė IEEE Transactions on Reliability 68 4 1311–1319 2019 8.5
平均評価: / 5 ( 件のレビュー)
1673 A Novel Method for Sensor Data Validation based on the analysis of Wavelet Transform Scalograms
Francesco Cannarile, Piero Baraldi, Pierluigi Colombo, Enrico Zio International Journal of Prognostics and Health Management 9 1 2670–None 2018 8.5
平均評価: / 5 ( 件のレビュー)
1674 Exact Inference on Weibull Parameters With Multiply Type-I Censored Data
Xiang Jia, Saralees Nadarajah, Bo Guo IEEE Transactions on Reliability 67 2 432–445 2018 8.5
平均評価: / 5 ( 件のレビュー)
1675 Fast Bayesian Inference of Reparameterized Gamma Process With Random Effects
Shirong Zhou, Ancha Xu, Yincai Tang, Lijuan Shen IEEE Transactions on Reliability 73 1 399–412 2024 8.49
平均評価: / 5 ( 件のレビュー)
1676 Data Evaluation and Enhancement for Quality Improvement of Machine Learning
Haihua Chen, Jiangping Chen, Junhua Ding IEEE Transactions on Reliability 70 2 831–847 2021 8.49
平均評価: / 5 ( 件のレビュー)
1677 Prognostics Using an Adaptive Self-Cognizant Dynamic System Approach
Guangxing Bai, Pingfeng Wang IEEE Transactions on Reliability 65 3 1427–1437 2016 8.49
平均評価: / 5 ( 件のレビュー)
1678 Reliability Optimization of Uncertain Random Systems Combined With Burn-In and Preventive Maintenance
Qinqin Xu, Yuanguo Zhu IEEE Transactions on Reliability 72 3 1134–1146 2023 8.48
平均評価: / 5 ( 件のレビュー)
1679 Replacement and Repair Optimization for Production Systems Under Random Production Waits
Jiawen Hu, Qiuzhuang Sun, Zhi-Sheng Ye IEEE Transactions on Reliability 71 4 1488–1500 2022 8.48
平均評価: / 5 ( 件のレビュー)
1680 Model Uncertainty in Accelerated Degradation Testing Analysis
Le Liu, Xiao-Yang Li, Enrico Zio, Rui Kang, Tong-Min Jiang IEEE Transactions on Reliability 66 3 603–615 2017 8.48
平均評価: / 5 ( 件のレビュー)