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| 順位 | タイトル | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 雑誌 | 巻 | 号 | ページ | 年 | PKVアクセス数 | |||
| 1641 | Novel Double-Node-Upset-Tolerant Memory Cell Designs Through Radiation-Hardening-by-Design and Layout | ||||||||
| Aibin Yan, Zhen Wu, Jing Guo, Jie Song, Xiaoqing Wen | IEEE Transactions on Reliability | 68 | 1 | 354–363 | 2019 | 4.77 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1642 | Anomaly Detection Techniques Based on Kappa-Pruned Ensembles | ||||||||
| Md. Shariful Islam, Wael Khreich, Abdelwahab Hamou-Lhadj | IEEE Transactions on Reliability | 67 | 1 | 212–229 | 2018 | 4.77 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1643 | A Compiler Technique for Processor-Wide Protection From Soft Errors in Multithreaded Environments | ||||||||
| Moslem Didehban, Aviral Shrivastava | IEEE Transactions on Reliability | 67 | 1 | 249–263 | 2018 | 4.77 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1644 | Cubic Dynamic Uncertain Causality Graph: A New Methodology for Modeling and Reasoning About Complex Faults With Negative Feedbacks | ||||||||
| Chunling Dong, Zhenxu Zhou, Qin Zhang | IEEE Transactions on Reliability | 67 | 3 | 920–932 | 2018 | 4.77 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1645 | Optimal Inspection and Replacement Policies for Multi-Unit Systems Subject to Degradation | ||||||||
| Qiuzhuang Sun, Zhi-Sheng Ye, Nan Chen | IEEE Transactions on Reliability | 67 | 1 | 401–413 | 2018 | 4.77 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1646 | A Scalable Solution to Soft Error Tolerant Circuit Design Using Partitioning-Based Gate Sizing | ||||||||
| Mohamad Imran Bandan, Samuel Pagliarini, Jimson Mathew, Dhiraj Pradhan | IEEE Transactions on Reliability | 66 | 1 | 245–256 | 2017 | 4.77 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1647 | A Novel Methodology for Fault Identification of Multi-stage Manufacturing Process Using Product Quality Measurement | ||||||||
| Xiaorui Tong, Hossein D. Ardakani, David Siegel, Ellen Gamel, Jay Lee | International Journal of Prognostics and Health Management | 8 | 1 | 2534–None | 2017 | 4.77 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1648 | A Transistor-Level Probabilistic Approach for Reliability Analysis of Arithmetic Circuits With Applications to Emerging Technologies | ||||||||
| Bodapati Srinivasu, K. Sridharan | IEEE Transactions on Reliability | 66 | 2 | 440–457 | 2017 | 4.77 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1649 | Maintenance Policies for a Deteriorating System Subject to Non-Self-Announcing Failures | ||||||||
| Mimi Zhang, Matthew Revie | IEEE Transactions on Reliability | 66 | 1 | 219–232 | 2017 | 4.77 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1650 | Modeling and Analysis of Cascading Failures in Industrial Internet of Things Considering Sensing-Control Flow and Service Community | ||||||||
| Dingyi Zheng, Xiuwen Fu, Xiangwei Liu, Liudong Xing, Rui Peng | IEEE Transactions on Reliability | 74 | 2 | 2723–2737 | 2025 | 4.75 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||