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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
1631 Dynamic Security Assessment Framework for Steel Casting Workshops in Smart Factory
Jinfang Jiang, Guangjie Han, Hongbo Zhu, Chuan Lin IEEE Transactions on Reliability 72 4 1569–1579 2023 4.77
平均評価: / 5 ( 件のレビュー)
1632 Intelligent Diagnosis Using Continuous Wavelet Transform and Gauss Convolutional Deep Belief Network
Huimin Zhao, Jie Liu, Huayue Chen, Jie Chen, Yang Li, Junjie Xu, Wu Deng IEEE Transactions on Reliability 72 2 692–702 2023 4.77
平均評価: / 5 ( 件のレビュー)
1633 Adversarial Security Verification of Data-Driven FDC Systems
Yue Zhuo, Zhiqiang Ge IEEE Transactions on Reliability 72 4 1580–1593 2023 4.77
平均評価: / 5 ( 件のレビュー)
1634 AttSum: A Deep Attention-Based Summarization Model for Bug Report Title Generation
Xiaoxue Ma, Jacky Wai Keung, Xiao Yu, Huiqi Zou, Jingyu Zhang, Yishu Li IEEE Transactions on Reliability 72 4 1663–1677 2023 4.77
平均評価: / 5 ( 件のレビュー)
1635 A Formal Verification Method for the SOPC Software
Shan Zhou, Jinbo Wang, Jiao Jia, Chi Zhang, Ruixue Wang IEEE Transactions on Reliability 71 2 818–829 2022 4.77
平均評価: / 5 ( 件のレビュー)
1636 Production Monitoring to Improve Test Suites
Deepika Tiwari, Long Zhang, Martin Monperrus, Benoit Baudry IEEE Transactions on Reliability 71 3 1381–1397 2022 4.77
平均評価: / 5 ( 件のレビュー)
1637 Model Agnostic Defence Against Backdoor Attacks in Machine Learning
Sakshi Udeshi, Shanshan Peng, Gerald Woo, Lionell Loh, Louth Rawshan, Sudipta Chattopadhyay IEEE Transactions on Reliability 71 2 880–895 2022 4.77
平均評価: / 5 ( 件のレビュー)
1638 Theoretical Analysis and Empirical Study on the Impact of Coincidental Correct Test Cases in Multiple Fault Localization
Yonghao Wu, Yong Liu, Weibo Wang, Zheng Li, Xiang Chen, Paul Doyle IEEE Transactions on Reliability 71 2 830–849 2022 4.77
平均評価: / 5 ( 件のレビュー)
1639 A Deep Learning Based Data Fusion Method for Degradation Modeling and Prognostics
Feng Wang, Juan Du, Yang Zhao, Tao Tang, Jianjun Shi IEEE Transactions on Reliability 70 2 775–789 2021 4.77
平均評価: / 5 ( 件のレビュー)
1640 Reliability-Aware Offloading and Allocation in Multilevel Edge Computing System
Luobing Dong, Weili Wu, Qiumin Guo, Meghana N. Satpute, Taieb Znati, Ding Zhu Du IEEE Transactions on Reliability 70 1 200–211 2021 4.77
平均評価: / 5 ( 件のレビュー)