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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
1591 First and Last Triggering Event Approaches for Replacement With Minimal Repairs
Xufeng Zhao, Khalifa N. Al-Khalifa, Abdel Magid Hamouda, Toshio Nakagawa IEEE Transactions on Reliability 65 1 197–207 2016 4.81
平均評価: / 5 ( 件のレビュー)
1592 Injecting Intermittent Faults for the Dependability Assessment of a Fault-Tolerant Microcomputer System
Daniel Gil-Tomás, Joaquín Gracia-Morán, J.-Carlos Baraza-Calvo, Luis-J. Saiz-Adalid, Pedro-J. Gil-Vicente IEEE Transactions on Reliability 65 2 648–661 2016 4.81
平均評価: / 5 ( 件のレビュー)
1593 A Nonlinear Prognostic Model for Degrading Systems With Three-Source Variability
Jian-Fei Zheng, Xiao-Sheng Si, Chang-Hua Hu, Zheng-Xin Zhang, Wei Jiang IEEE Transactions on Reliability 65 2 736–750 2016 4.81
平均評価: / 5 ( 件のレビュー)
1594 Reliability and Joint Reliability Importance in a Consecutive-k-Within-m-out-of- n:F System With Markov-Dependent Components
Xiaoyan Zhu, Mahmoud Boushaba, Mohamed Reghioua IEEE Transactions on Reliability 65 2 802–815 2016 4.81
平均評価: / 5 ( 件のレビュー)
1595 A Novel Hybrid Method of Parameters Tuning in Support Vector Regression for Reliability Prediction: Particle Swarm Optimization Combined With Analytical Selection
Wei Zhao, Tao Tao, Enrico Zio, Wenbin Wang IEEE Transactions on Reliability 65 3 1393–1405 2016 4.81
平均評価: / 5 ( 件のレビュー)
1596 Robust Particle Filters for Fatigue Crack Growth Estimation in Rotorcraft Structures
Mulugeta A. Haile, Jaret C. Riddick, Abey H. Assefa IEEE Transactions on Reliability 65 3 1438–1448 2016 4.81
平均評価: / 5 ( 件のレビュー)
1597 MEMRES: A Fast Memory System Reliability Simulator
Shaodi Wang, Henry Hu, Hongzhong Zheng, Puneet Gupta IEEE Transactions on Reliability 65 4 1783–1797 2016 4.81
平均評価: / 5 ( 件のレビュー)
1598 General (N,T,τ) Opportunistic Maintenance for Multicomponent Systems With Evident and Hidden Failures
Lu Zhao, Maoyin Chen, Donghua Zhou IEEE Transactions on Reliability 65 3 1298–1313 2016 4.81
平均評価: / 5 ( 件のレビュー)
1599 Multi-Objective and Multi-Stage Reliability Growth Planning in Early Product-Development Stage
Zhaojun Li, Mohammadsadegh Mobin, Thomas Keyser IEEE Transactions on Reliability 65 2 769–781 2016 4.81
平均評価: / 5 ( 件のレビュー)
1600 Computing Barlow-Proschan Importance in Combined Systems
Serkan Eryilmaz IEEE Transactions on Reliability 65 1 159–163 2016 4.81
平均評価: / 5 ( 件のレビュー)