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Fatigue crack propagation behavior of multiphase microstructure in a quenched and partitioned medium-carbon bainitic steel
| 順位 | タイトル | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 雑誌 | 巻 | 号 | ページ | 年 | PKVアクセス数 | |||
| 1551 | Dynamic Risk Assessment Based on Statistical Failure Data and Condition-Monitoring Degradation Data | ||||||||
| Zhiguo Zeng, Enrico Zio | IEEE Transactions on Reliability | 67 | 2 | 609–622 | 2018 | 4.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1552 | An Ensemble of Component-Based and Population-Based Self-Organizing Maps for the Identification of the Degradation State of Insulated-Gate Bipolar Transistors | ||||||||
| Marco Rigamonti, Piero Baraldi, Allegra Alessi, Enrico Zio, Daniel Astigarraga, Ainhoa Galarza | IEEE Transactions on Reliability | 67 | 3 | 1304–1313 | 2018 | 4.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1553 | Comparison of Vibration, Sound and Motor Current Signature Analysis for Detection of Gear Box Faults | ||||||||
| T Praveenkumar, M Saimurugan, K I Ramachandran | International Journal of Prognostics and Health Management | 8 | 2 | 2642–None | 2017 | 4.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1554 | Availability Model of a PHM-Equipped Component | ||||||||
| Michele Compare, Luca Bellani, Enrico Zio | IEEE Transactions on Reliability | 66 | 2 | 487–501 | 2017 | 4.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1555 | Prognosis of Structural Damage Growth Via Integration of Physical Model Prediction and Bayesian Estimation | ||||||||
| Yuhang Liu, Qi Shuai, Shiyu Zhou, Jiong Tang | IEEE Transactions on Reliability | 66 | 3 | 700–711 | 2017 | 4.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1556 | Dynamic Optimization of Process Quality Control and Maintenance Planning | ||||||||
| Amit Kumar Jain, Bhupesh Kumar Lad | IEEE Transactions on Reliability | 66 | 2 | 502–517 | 2017 | 4.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1557 | A Novel Layout-Based Single Event Transient Injection Approach to Evaluate the Soft Error Rate of Large Combinational Circuits in Complimentary Metal-Oxide-Semiconductor Bulk Technology | ||||||||
| Yankang Du, Shuming Chen | IEEE Transactions on Reliability | 65 | 1 | 248–255 | 2016 | 4.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1558 | A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides | ||||||||
| Seong-Joon Kim, Tao Yuan, Suk Joo Bae | IEEE Transactions on Reliability | 65 | 1 | 263–271 | 2016 | 4.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1559 | Age-Based Replacement Policy With Consideration of Production Wait Time | ||||||||
| Ping Li, Wenbin Wang, Rui Peng | IEEE Transactions on Reliability | 65 | 1 | 235–247 | 2016 | 4.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1560 | Optimal Cable Laying Across an Earthquake Fault Line Considering Elliptical Failures | ||||||||
| Cong Cao, Zengfu Wang, Moshe Zukerman, Jonathan H. Manton, Alain Bensoussan, Yu Wang | IEEE Transactions on Reliability | 65 | 3 | 1536–1550 | 2016 | 4.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||