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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1501 Constraint Handling in NSGA-II for Solving Optimal Testing Resource Allocation Problems
Guofu Zhang, Zhaopin Su, Miqing Li, Feng Yue, Jianguo Jiang, Xin Yao IEEE Transactions on Reliability 66 4 1193–1212 2017 9.39
平均評価: / 5 ( 件のレビュー)
1502 Detecting Bugs of Concurrent Programs With Program Invariants
Rong Wang, Zuohua Ding, Ning Gui, Yang Liu IEEE Transactions on Reliability 66 2 425–439 2017 9.35
平均評価: / 5 ( 件のレビュー)
1503 Autopsy Data Analysis for a Series System With Active Redundancy Under a Load-Sharing Model
Man Ho Ling, Hon Keung Tony Ng, Ping Shing Chan, Narayanaswamy Balakrishnan IEEE Transactions on Reliability 65 2 957–968 2016 9.34
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1504 A Synthesis-Component-Based GO-FLOW Modeling Paradigm for Automated Time-Dependent and Phased-Mission Reliability Model Generation and Analysis
Zhanyu He, Jun Yang, Yongyue Chu IEEE Transactions on Reliability 74 3 3681–3694 2025 9.32
平均評価: / 5 ( 件のレビュー)
1505 Bayesian Reliability Assessment of Permanent Magnet Brake Under Small Sample Size
Ancha Xu, Binbing Wang, Di Zhu, Jihong Pang, Xinze Lian IEEE Transactions on Reliability 74 1 2107–2117 2025 9.32
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1506 System Reliability Modeling Considering Correlated Probabilistic Competing Failures
Yujie Wang, Liudong Xing, Honggang Wang, David W. Coit IEEE Transactions on Reliability 67 2 416–431 2018 9.31
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1507 Statistical Inference of the Reliability for Generalized Exponential Distribution Under Progressive Type-II Censoring Schemes
Lei Guo, Wenhao Gui IEEE Transactions on Reliability 67 2 470–480 2018 9.31
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1508 Probabilistic Reliability via Subsystem Structures of Arrangement Graph Networks
Yanze Huang, Limei Lin, Li Xu, Sun-Yuan Hsieh IEEE Transactions on Reliability 73 1 279–289 2024 9.3
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1509 Reliability Analysis Toward a Family of Interconnection Networks and Data Center Networks
Yihong Wang, Weibei Fan, Baolei Cheng, Yan Wang, Jianxi Fan IEEE Transactions on Reliability 74 4 4636–4649 2025 9.24
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1510 UNA: Improving Automated PL-NL System by A Unified Neural Architecture
Dawei Yuan, Tao Zhang, He Jiang IEEE Transactions on Reliability 74 3 3585–3599 2025 9.22
平均評価: / 5 ( 件のレビュー)