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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
141 An Online Bayesian Framework for Identifying Latent System Degradation States
Di Zhu, Ancha Xu, Ziqi Chen, Shuling Ding, Guanqi Fang IEEE Transactions on Reliability 75 1 542–554 2026 15.23
平均評価: / 5 ( 件のレビュー)
142 A Two-Step Sub-Sampling Approach for a Computationally Efficient Particle Filter-Based Prognosis
Kevin Espinoza, Jorge García Bustos, Leonardo Baldo, Francisco Jaramillo-Montoya, David Acuña-Ureta, Marcos Orchard IEEE Transactions on Reliability 75 1 791–803 2026 15.18
平均評価: / 5 ( 件のレビュー)
143 Benchmarking Software Aging Effects in Container Platforms
Pedro Melo, João Ferreira, Jean Araujo, Marco Vieira IEEE Transactions on Reliability 74 4 5015–5029 2025 15.11
平均評価: / 5 ( 件のレビュー)
144 Fault-Tolerant Control for Four-Wheels Independently Actuated Electric Vehicles
Farah Shalhoub, Majd Saied, Clovis Francis, Hussein Termous, Hassan Shraim International Journal of Prognostics and Health Management 17 1 4622–None 2026 15.06
平均評価: / 5 ( 件のレビュー)
145 Generalizable Fault Diagnosis Under Distribution Shifts Induced by Unseen Working Conditions via Synthetic and Adversarial Sample Learning
Xiaochen Zhang, Sen Yan, Chen Wang, Te Han IEEE Transactions on Reliability 74 4 5517–5530 2025 15.05
平均評価: / 5 ( 件のレビュー)
146 An Online Adaptive Multidegradation Model for Accurate Remaining Useful Life Prediction
Zhijian Wang, Zhijie Li, Weibo Ren, Zhongxin Chen, Yanfeng Li, Lei Dong, Xiaosheng Si, Xin Fan IEEE Transactions on Reliability 74 4 5475–5486 2025 15.03
平均評価: / 5 ( 件のレビュー)
147 Attention-Based Mask Network Model for Multirate Sampling Data Fault Diagnosis
Keke Huang, Zeyi Liu, Shujie Wu, Chunhua Yang, Weihua Gui IEEE Transactions on Reliability 74 4 5592–5602 2025 15.01
平均評価: / 5 ( 件のレビュー)
148 Smart Contract Vulnerability Detection Based on Dual Adversarial Domain Adaptation
Siyu Jiang, Xue Zhang, Zhiwen Xu, Feng Guo, Jiahui Chen, Di Chen IEEE Transactions on Reliability 74 4 5104–5118 2025 14.99
平均評価: / 5 ( 件のレビュー)
149 Toward a Robust Ingress for Open-Sourced 5G Core Network
Jin-Wei Hsu, Xin-Ye Jiang, I-Wei Chen, Kai-Jung Chen, Chuan Ou-Yang, Chun-Ying Huang IEEE Transactions on Reliability 74 4 4544–4558 2025 14.92
平均評価: / 5 ( 件のレビュー)
150 Adaptive Random Testing of Deep Learning Systems Using Image Hashing
Linwei Yi, Chenhui Cui, Rubing Huang, Dave Towey, Rongcun Wang IEEE Transactions on Reliability 74 4 4985–4999 2025 14.86
平均評価: / 5 ( 件のレビュー)