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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1471 Optimal Design for Destructive Degradation Tests With Random Initial Degradation Values Using the Wiener Process
Xun Xiao, Zhisheng Ye IEEE Transactions on Reliability 65 3 1327–1342 2016 9.46
平均評価: / 5 ( 件のレビュー)
1472 A Mimic-Filling Algorithm for Pairwise Model Discrimination of Censoring Lifetime Data
Fanbing Meng, Jun Yang, Min Xie IEEE Transactions on Reliability 74 1 2255–2264 2025 9.45
平均評価: / 5 ( 件のレビュー)
1473 Reflexive Event-B: Semantics and Correctness the EB4EB Framework
Peter Rivière, Neeraj Kumar Singh, Yamine Aït-Ameur IEEE Transactions on Reliability 73 2 835–850 2024 9.45
平均評価: / 5 ( 件のレビュー)
1474 Importance Measure for Multilevel Inspections of Multistate Systems: A Value of Information Perspective
Boyuan Zhang, Yu Liu, Tangfan Xiahou IEEE Transactions on Reliability 73 2 885–901 2024 9.45
平均評価: / 5 ( 件のレビュー)
1475 Modeling and Verification Methods for Spatio-Temporal Consistency of CPS in Uncertain Environments
Shuqi Pan, Changjing Wang, Wuping Xie, Jiaxing Lu, Qing Huang, Zhengkang Zuo IEEE Transactions on Reliability 73 4 1849–1862 2024 9.45
平均評価: / 5 ( 件のレビュー)
1476 A Hidden Markov Model for Condition Monitoring of Time Series Data in Complex Network Systems
Wanshan Li, Chen Zhang IEEE Transactions on Reliability 72 4 1478–1492 2023 9.45
平均評価: / 5 ( 件のレビュー)
1477 Accelerated Degradation Testing With Long-Term Memory Effects
Wujun Si, Yunfei Shao, Wei Wei IEEE Transactions on Reliability 69 4 1254–1266 2020 9.45
平均評価: / 5 ( 件のレビュー)
1478 A Machine-Learning-Driven Evolutionary Approach for Testing Web Application Firewalls
Dennis Appelt, Cu D. Nguyen, Annibale Panichella, Lionel C. Briand IEEE Transactions on Reliability 67 3 733–757 2018 9.45
平均評価: / 5 ( 件のレビュー)
1479 Prediction Intervals for Landslide Displacement Based on Switched Neural Networks
Cheng Lian, C. L. Philip Chen, Zhigang Zeng, Wei Yao, Huiming Tang IEEE Transactions on Reliability 65 3 1483–1495 2016 9.45
平均評価: / 5 ( 件のレビュー)
1480 Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches
Antonio J. Sanchez-Clemente, Luis Entrena, Radek Hrbacek, Lukas Sekanina IEEE Transactions on Reliability 65 4 1871–1883 2016 9.45
平均評価: / 5 ( 件のレビュー)