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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
1461 Inference for the Wiener Process With Random Initiation Time
Christian Paroissin IEEE Transactions on Reliability 65 1 147–157 2016 5.73
平均評価: / 5 ( 件のレビュー)
1462 BFKD: Blockchain-Based Federated Knowledge Distillation for Aviation Internet of Things
Wu Deng, Xinyan Li, Junjie Xu, Weihan Li, Guangtian Zhu, Huimin Zhao IEEE Transactions on Reliability 74 2 2626–2639 2025 5.71
平均評価: / 5 ( 件のレビュー)
1463 Stackelberg Game-Based Computation Offloading and Pricing in UAV Assisted Vehicular Networks
Liwei Geng, Hongbo Zhao, Changming Zou IEEE Transactions on Reliability 74 1 2333–2347 2025 5.71
平均評価: / 5 ( 件のレビュー)
1464 Adjusted Trust Score: A Novel Approach for Estimating the Trustworthiness of Software Defect Prediction Models
Xiaohui Wan, Zheng Zheng, Fangyun Qin, Xuhui Lu, Kun Qiu IEEE Transactions on Reliability 73 4 1877–1891 2024 5.71
平均評価: / 5 ( 件のレビュー)
1465 Reliability-Driven End–End–Edge Collaboration for Energy Minimization in Large-Scale Cyber-Physical Systems
Kun Cao, Jian Weng, Keqin Li IEEE Transactions on Reliability 73 1 230–244 2024 5.71
平均評価: / 5 ( 件のレビュー)
1466 Sparse and Flexible Convex-Hull Representation for Machine Degradation Modeling
Tongtong Yan, Yuting Wang, Tangbin Xia, Bingchang Hou, Lifeng Xi, Dong Wang IEEE Transactions on Reliability 72 1 27–36 2023 5.71
平均評価: / 5 ( 件のレビュー)
1467 A Classical and Machine Learning-Based Reliability Analysis on Catalan Object Encryption Scheme
Rajat Sadhukhan IEEE Transactions on Reliability 71 2 1022–1032 2022 5.71
平均評価: / 5 ( 件のレビュー)
1468 Adaptive Fault Detection and Isolation for Active Suspension Systems With Model Uncertainties
Shuai Yan, Weichao Sun, Fenghua He, Jianyong Yao IEEE Transactions on Reliability 68 3 927–937 2019 5.71
平均評価: / 5 ( 件のレビュー)
1469 Fast Algorithm for Searching d -MPs for all Possible d
Wei-Chang Yeh IEEE Transactions on Reliability 67 1 308–315 2018 5.71
平均評価: / 5 ( 件のレビュー)
1470 Bounded Reordering in the Distributed Test Architecture
Robert M. Hierons, Mercedes G. Merayo, Manuel Nuñez IEEE Transactions on Reliability 67 2 522–537 2018 5.71
平均評価: / 5 ( 件のレビュー)