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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
1451 Optimal Inspection Policy for a Single-Unit System Considering Two Failure Modes and Production Wait Time
Hui Xiao, Yuanmin Yan, Gang Kou, Shaomin Wu IEEE Transactions on Reliability 72 1 395–407 2023 5.73
平均評価: / 5 ( 件のレビュー)
1452 Davida: A Decentralization Approach to Localizing Transaction Sequences for Debugging Transactional Atomicity Violations
Xiaoxue Ma, Imran Ashraf, W. K. Chan IEEE Transactions on Reliability 72 2 808–826 2023 5.73
平均評価: / 5 ( 件のレビュー)
1453 ReMuSSE: A Redundant Mutant Identification Technique Based on Selective Symbolic Execution
Chang-ai Sun, An Fu, Xinling Guo, Tsong Yueh Chen IEEE Transactions on Reliability 71 1 415–428 2022 5.73
平均評価: / 5 ( 件のレビュー)
1454 Cyber LOPA: An Integrated Approach for the Design of Dependable and Secure Cyber-Physical Systems
Ashraf Tantawy, Sherif Abdelwahed, Abdelkarim Erradi IEEE Transactions on Reliability 71 2 1075–1091 2022 5.73
平均評価: / 5 ( 件のレビュー)
1455 A Model-Ranking Approach for Estimation Based on Accelerated Degradation Test Data
Ling Li, Hon Keung Tony Ng, Ali H. Algarni, Abdullah M. Almarashi, Zaher A. Abo-Eleneen IEEE Transactions on Reliability 69 2 484–496 2020 5.73
平均評価: / 5 ( 件のレビュー)
1456 Defense Resource Allocation Against Sequential Unintentional and Intentional Impacts
Rui Peng, Di Wu, Qingqing Zhai IEEE Transactions on Reliability 68 1 364–374 2019 5.73
平均評価: / 5 ( 件のレビュー)
1457 Optimal System Design and Sequential Preventive Maintenance Under Uncertain Aperiodic-Changing Stresses
Xiaoyan Zhu, Xiaoqiang Bei, Nida Chatwattanasiri, David W. Coit IEEE Transactions on Reliability 67 3 907–919 2018 5.73
平均評価: / 5 ( 件のレビュー)
1458 A Collaborative Learning Framework for Estimating Many Individualized Regression Models in a Heterogeneous Population
Ying Lin, Kaibo Liu, Eunshin Byon, Xiaoning Qian, Shan Liu, Shuai Huang IEEE Transactions on Reliability 67 1 328–341 2018 5.73
平均評価: / 5 ( 件のレビュー)
1459 Evaluation of Conducted Emission Test Methods for Charge Pump DC/DC Converters
Wei Hong, Shaoping Wang, Mileta M. Tomovic, Haokuo Liu, Jian Shi, Xingjian Wang IEEE Transactions on Reliability 66 1 170–177 2017 5.73
平均評価: / 5 ( 件のレビュー)
1460 Planning Repeated Degradation Testing for Products With Three-Source Variability
Zheng-Xin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Qi Zhang, Tian-Mei Li, Cong-Qi Xu IEEE Transactions on Reliability 65 2 640–647 2016 5.73
平均評価: / 5 ( 件のレビュー)