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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1421 Joint Reliability Importance in Coherent Systems With Exchangeable Dependent Components
Serkan Eryilmaz, Ozlem Ege Oruc, Volkan Oger IEEE Transactions on Reliability 65 3 1562–1570 2016 9.54
平均評価: / 5 ( 件のレビュー)
1422 A Novel Adaptive Bayesian Model Averaging-Based Multiple Kriging Method for Structural Reliability Analysis
Manman Dong, Yongbo Cheng, Liangqi Wan IEEE Transactions on Reliability 74 1 2185–2199 2025 9.52
平均評価: / 5 ( 件のレビュー)
1423 ME-SFP: A Mixture-of-Experts-Based Approach for Software Fault Prediction
Aman Omer, Santosh Singh Rathore, Sandeep Kumar IEEE Transactions on Reliability 73 1 710–725 2024 9.52
平均評価: / 5 ( 件のレビュー)
1424 Fault-Tolerant Control of Stochastic Strict-Feedback Nonlinear Systems With Multiple Faults
Tong Wang, Zhihong Zhao, Nan Wang IEEE Transactions on Reliability 73 3 1684–1692 2024 9.52
平均評価: / 5 ( 件のレビュー)
1425 Oscillatory Lempel–Ziv Complexity Calculation as a Nonlinear Measure for Continuous Monitoring of Bearing Health
Khandaker Noman, Yongbo Li, Shubin Si, Shun Wang, Gang Mao IEEE Transactions on Reliability 72 1 151–165 2023 9.52
平均評価: / 5 ( 件のレビュー)
1426 How Developers Modify Pull Requests in Code Review
Jing Jiang, Jiangfeng Lv, Jiateng Zheng, Li Zhang IEEE Transactions on Reliability 71 3 1325–1339 2022 9.52
平均評価: / 5 ( 件のレビュー)
1427 Editorial Emerging Trends in Trustworthy Computing
Winston Shieh IEEE Transactions on Reliability 71 4 1399–1400 2022 9.52
平均評価: / 5 ( 件のレビュー)
1428 Detection of Driver Vigilance Level Using EEG Signals and Driving Contexts
Zizheng Guo, Yufan Pan, Guozhen Zhao, Shi Cao, Jun Zhang IEEE Transactions on Reliability 67 1 370–380 2018 9.52
平均評価: / 5 ( 件のレビュー)
1429 Evaluation of Conducted Emission Test Methods for Charge Pump DC/DC Converters
Wei Hong, Shaoping Wang, Mileta M. Tomovic, Haokuo Liu, Jian Shi, Xingjian Wang IEEE Transactions on Reliability 66 1 170–177 2017 9.52
平均評価: / 5 ( 件のレビュー)
1430 Nonparametric Bayesian Analysis for Masked Data From Hybrid Systems in Accelerated Lifetime Tests
Bin Liu, Yimin Shi, Jing Cai, Xuchao Bai, Chunfang Zhang IEEE Transactions on Reliability 66 3 662–676 2017 9.52
平均評価: / 5 ( 件のレビュー)