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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
1301 Fault Tree Analysis Including Component Dependencies
Silvia Tolo, John Andrews IEEE Transactions on Reliability 73 1 413–421 2024 6.69
平均評価: / 5 ( 件のレビュー)
1302 SusRec: An Approach to Sustainable Developer Recommendation for Bug Resolution Using Multimodal Ensemble Learning
Wen Zhang, Jiangpeng Zhao, Rui Peng, Song Wang, Ye Yang IEEE Transactions on Reliability 72 1 61–78 2023 6.69
平均評価: / 5 ( 件のレビュー)
1303 A Hidden Markov Model for Condition Monitoring of Time Series Data in Complex Network Systems
Wanshan Li, Chen Zhang IEEE Transactions on Reliability 72 4 1478–1492 2023 6.69
平均評価: / 5 ( 件のレビュー)
1304 Universal Reliability Bounds for Sparse Networks
Pablo Romero IEEE Transactions on Reliability 71 1 359–369 2022 6.69
平均評価: / 5 ( 件のレビュー)
1305 Failure Mode and Effects Analysis by Using the House of Reliability-Based Rough VIKOR Approach
Zhen Wang, Jian-Min Gao, Rong-Xi Wang, Kun Chen, Zhi-Yong Gao, Wei Zheng IEEE Transactions on Reliability 67 1 230–248 2018 6.69
平均評価: / 5 ( 件のレビュー)
1306 Void Formation and Their Effect on Reliability of Lead-Free Solder Joints on MID and PCB Substrates
P. Wild, T. Grözinger, D. Lorenz, A. Zimmermann IEEE Transactions on Reliability 66 4 1229–1237 2017 6.69
平均評価: / 5 ( 件のレビュー)
1307 Cold Standby Systems With Imperfect Backup
Gregory Levitin, Liudong Xing, Yuanshun Dai IEEE Transactions on Reliability 65 4 1798–1809 2016 6.69
平均評価: / 5 ( 件のレビュー)
1308 Model-Based Fault Diagnosis of a Planetary Gear: A Novel Approach Using Transmission Error
Jungho Park, Jong Moon Ha, Hyunseok Oh, Byeng D. Youn, Joo-Ho Choi, Nam Ho Kim IEEE Transactions on Reliability 65 4 1830–1841 2016 6.69
平均評価: / 5 ( 件のレビュー)
1309 Modelling a Bathtub-Shaped Failure Rate by a Coxian Distribution
Qihong Duan, Junrong Liu IEEE Transactions on Reliability 65 2 878–885 2016 6.69
平均評価: / 5 ( 件のレビュー)
1310 Error Mitigation Using Approximate Logic Circuits: A Comparison of Probabilistic and Evolutionary Approaches
Antonio J. Sanchez-Clemente, Luis Entrena, Radek Hrbacek, Lukas Sekanina IEEE Transactions on Reliability 65 4 1871–1883 2016 6.69
平均評価: / 5 ( 件のレビュー)