アクセスランキング（PKV）
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Mechanical Engineering
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Jubilee Review: The 65 Years of the ASME Machine Design Award (1958–2023)
| 順位 | タイトル | ||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 雑誌 | 巻 | 号 | ページ | 年 | PKVアクセス数 | |||
| 1181 | An Analysis on the Reliability of the Alternating Group Graph | ||||||||
| Limei Lin, Yanze Huang, Yuhang Lin, Li Xu, Sun-Yuan Hsieh | IEEE Transactions on Reliability | 70 | 4 | 1542–1555 | 2021 | 6.84 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1182 | Test Methodologies and Test-Time Compression for Emerging Non-Volatile Memory | ||||||||
| Mohammad Nasim Imtiaz Khan, Swaroop Ghosh | IEEE Transactions on Reliability | 69 | 4 | 1387–1397 | 2020 | 6.84 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1183 | On the Anti-Interference Tolerance of Cognitive Frequency Hopping Communication Systems | ||||||||
| Chenxi Li, Peihan Qi, Danyang Wang, Zan Li | IEEE Transactions on Reliability | 69 | 4 | 1453–1464 | 2020 | 6.84 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1184 | Editorial Emerging Trends in Trustworthy Computing | ||||||||
| Winston Shieh | IEEE Transactions on Reliability | 71 | 4 | 1399–1400 | 2022 | 6.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1185 | Formal Analysis of Multiple-Cell Upset Failure Based on Common Cause Failure Theory | ||||||||
| Qi Shao, Shunkun Yang, Xiaodong Gou | IEEE Transactions on Reliability | 70 | 4 | 1495–1509 | 2021 | 6.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1186 | Guest Editorial: Special Section on IEEE International Conference on Software Quality, Reliability, and Security (QRS) 2020 | ||||||||
| W. K. Chan, Mei Nagappan, Christof J. Budnik | IEEE Transactions on Reliability | 70 | 2 | 442–442 | 2021 | 6.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1187 | Remaining Useful Life Prediction Based on Normalizing Flow Embedded Sequence-to-Sequence Learning | ||||||||
| Haosen Yang, Keqin Ding, Robert C. Qiu, Tiebin Mi | IEEE Transactions on Reliability | 70 | 4 | 1342–1354 | 2021 | 6.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1188 | Access Point Optimization for Reliable Indoor Localization Systems | ||||||||
| Min Jia, Sohaib Bin Altaf Khattak, Qing Guo, Xuemai Gu, Yun Lin | IEEE Transactions on Reliability | 69 | 4 | 1424–1436 | 2020 | 6.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1189 | A Fast and Effective Sensitivity Calculation Method for Circuit Input Vectors | ||||||||
| Jie Xiao, Jungang Lou, Jianhui Jiang | IEEE Transactions on Reliability | 68 | 3 | 938–953 | 2019 | 6.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||
| 1190 | Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data | ||||||||
| Man Ho Ling, Narayanaswamy Balakrishnan | IEEE Transactions on Reliability | 66 | 3 | 641–650 | 2017 | 6.83 | |||
| 平均評価: / 5 ( 件のレビュー) | |||||||||