Powered by Engineering Brain, Japan | What is PKV? | PKV Methodology | KnowledgeRank v4.0.0: PKV Trends of My Authored Papers Are Now Available on My Page

アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1151 Knowledge-Enhanced Spatial-Temporal Causal Analysis for Fault Detection of Nickel Top-Blown Furnace Sensors
Dongnian Jiang, Jinjiang Zhao, Dezhi Xu, Huanhuan Ran IEEE Transactions on Reliability 74 4 5618–5632 2025 10.94
平均評価: / 5 ( 件のレビュー)
1152 Field-Based Security Testing of SDN Configuration Updates
Jahanzaib Malik, Fabrizio Pastore IEEE Transactions on Reliability 74 3 3469–3483 2025 10.94
平均評価: / 5 ( 件のレビュー)
1153 One-Class Learning-Based Contrastive Reconstruction Framework for the Anomaly Detection of Reciprocating Machinery
Diego Cabrera, Jiapeng Wu, Mariela Cerrada, René-Vinicio Sánchez, Fernando Sancho, Jianyu Long, Chuan Li IEEE Transactions on Reliability 74 4 5465–5474 2025 10.94
平均評価: / 5 ( 件のレビュー)
1154 A Second-Order Optimization-Based Adaptive Attack Method for Deep Convolutional Neural Networks
Jin Ding, Jie-Chao Zhao, Yong-Zhi Sun, Ping Tan, Ji-En Ma, You-Tong Fang IEEE Transactions on Reliability 74 4 5219–5228 2025 10.94
平均評価: / 5 ( 件のレビュー)
1155 Integrated Temperature and Stress Sensors in Fan-Out Wafer-Level Packaging to Better Achieve the Third-Generation Reliability of Electronic Systems
Linwei Cao, Yuexing Wang, Kun Liu, Xiangou Zhang, Shuairong Deng, Quanfeng Zhou, Xiangyu Sun, Wanli Zhang IEEE Transactions on Reliability 74 3 4020–4031 2025 10.9
平均評価: / 5 ( 件のレビュー)
1156 Deep Reinforcement Learning in Power Systems Resilience: A Review
Di Cao, Yu Liu, Yinfan Wang, Qin Zhang, Weihao Hu IEEE Transactions on Reliability 74 4 5356–5370 2025 10.89
平均評価: / 5 ( 件のレビュー)
1157 A Reinforcement Learning-Driven Adversarial Attack Methods With Dynamic Perturbation Optimization
Lulu Wang, Xiaoyi Wang, Xiaoning Du, Jianming Chang, Bixin Li IEEE Transactions on Reliability 75 1 2668–2682 2026 10.86
平均評価: / 5 ( 件のレビュー)
1158 Achieving Jitter-Free Reliability for Time-Sensitive Networking
Bingkui Li, Lei Zhuang, Sijin Yang, Guoqing Wang, Ding Ma IEEE Transactions on Reliability 74 4 5727–5737 2025 10.85
平均評価: / 5 ( 件のレビュー)
1159 Mechanistic Modeling of Stress Evolution in Electrodeposited Copper Films at Room Temperature After Deposition
Simon Urich, Manuel Petersmann, Elisabeth Gorgasser, Julius Koolen, Werner Robl IEEE Transactions on Reliability 75 1 2422–2431 2026 10.84
平均評価: / 5 ( 件のレビュー)
1160 Dynamic Reliability Assessment Model for IoT-Enabled Smart Offshore Wind Farm
Hongyan Dui, Yulu Zhang, Xinmin Wu, Liudong Xing IEEE Transactions on Reliability 74 3 3529–3543 2025 10.84
平均評価: / 5 ( 件のレビュー)