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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1131 Probabilistic Risk Assessment of Station Blackouts in Nuclear Power Plants
Hindolo George-Williams, Min Lee, Edoardo Patelli IEEE Transactions on Reliability 67 2 494–512 2018 11.24
平均評価: / 5 ( 件のレビュー)
1132 Robust Quantile Analysis for Accelerated Life Test Data
Nan Chen, Yanlin Tang, Zhi-Sheng Ye IEEE Transactions on Reliability 65 2 901–913 2016 11.22
平均評価: / 5 ( 件のレビュー)
1133 PoFINN: Integrating Physics of Failure and Neural Networks for Long-Term Degradation Forecasting of Aluminum Electrolytic Capacitors
Anindya Bhattacharyya, Anurag Dutta, Rajendra Prasad Behera, Arup Dasgupta, Rajat Subhra Chakraborty IEEE Transactions on Reliability 74 4 5487–5501 2025 11.19
平均評価: / 5 ( 件のレビュー)
1134 TriVLLo: Tri-View Dynamic Architecture and Unified Cross-Modal Representation for Efficient Fine-Grained Vision–Language Understanding
Liang Kou, Wenlong Fan, Xingru Huang, Bai Lin, Bo Yang, Jilin Zhang, Yun Lin, Meiyu Wang IEEE Transactions on Reliability 75 1 1281–1290 2026 11.18
平均評価: / 5 ( 件のレビュー)
1135 Enhanced Feature Representation via Hybrid Feature Fusion for Coincidental Correctness Detection
Tao Zhang, Yan Lei, Huan Xie, Jian Hu, Chunyan Liu, Jingwen Cai IEEE Transactions on Reliability 75 1 1306–1320 2026 11.15
平均評価: / 5 ( 件のレビュー)
1136 Process Monitoring for Closed-Loop Control Systems With Incipient Faults
Xu Chen, Xiao He IEEE Transactions on Reliability 74 4 5347–5355 2025 11.12
平均評価: / 5 ( 件のレビュー)
1137 Reliable Data Forwarding for Information-Centric Underwater IoT
Xiaonan Wang, Yimin Lu, Demin Gao IEEE Transactions on Reliability 74 3 4222–4229 2025 11.1
平均評価: / 5 ( 件のレビュー)
1138 Observer-Based Finite-Time T–S Fuzzy Sliding Mode Controller Design for Unmanned Marine Vehicles Against Hybrid Attacks
Yanqian Wang, Pan Wang, Guangming Zhuang, Jianwei Xia IEEE Transactions on Reliability 74 4 4818–4831 2025 11.09
平均評価: / 5 ( 件のレビュー)
1139 Adaptive Accelerated Degradation Test Design for Tweedie Exponential Dispersion Process With Random Effects Based on the Predictive Remaining Useful Life
Huiling Zheng, Jun Yang, Wenda Kang, Yu Zhao IEEE Transactions on Reliability 74 4 4885–4899 2025 11.05
平均評価: / 5 ( 件のレビュー)
1140 Unified Accelerated Life Testing for One-Shot Devices With Weibull Lifetime Distributions
Hung-Ping Tung, Man Ho Ling IEEE Transactions on Reliability 75 1 171–180 2026 11.03
平均評価: / 5 ( 件のレビュー)