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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 ページ PKVアクセス数
1071 Toward an Analysis Method of Software Evolution Triggered by Place Change in Mobile Computing
Chao-Ze Lu, Guo-Sun Zeng IEEE Transactions on Reliability 72 2 527–541 2023 7.79
平均評価: / 5 ( 件のレビュー)
1072 Random Versus Copyset Placement: Data-Loss Models for Proactive-Tolerance Replica-Based Data Storage
Jing Li, Rebecca J. Stones, Jinfei Luo IEEE Transactions on Reliability 71 1 63–74 2022 7.79
平均評価: / 5 ( 件のレビュー)
1073 Transition Algebra for Software Testing
Pan Liu, Yihao Li, Huaikou Miao IEEE Transactions on Reliability 70 4 1438–1454 2021 7.79
平均評価: / 5 ( 件のレビュー)
1074 The Need for Aerospace Structural Health Monitoring
Graham Wild, Luke Pollock, Ayah Khalid Abdelwahab, John Murray International Journal of Prognostics and Health Management 12 3 2368–None 2021 7.79
平均評価: / 5 ( 件のレビュー)
1075 Ant Colony System With Sorting-Based Local Search for Coverage-Based Test Case Prioritization
Chengyu Lu, Jinghui Zhong, Yinxing Xue, Liang Feng, Jun Zhang IEEE Transactions on Reliability 69 3 1004–1020 2020 7.79
平均評価: / 5 ( 件のレビュー)
1076 Simulating faults in a Boeing 737-200 Environmental Control System using a thermodynamic model
Manuel Esperon-Miguez, Ian K. Jennions, Ignacio Camacho Escobar, Nile Hanov International Journal of Prognostics and Health Management 10 2 2731–None 2019 7.79
平均評価: / 5 ( 件のレビュー)
1077 Scheduling Preventive Maintenance Considering the Saturation Effect
Qiuzhuang Sun, Zhi-Sheng Ye, Weiwen Peng IEEE Transactions on Reliability 68 2 741–752 2019 7.79
平均評価: / 5 ( 件のレビュー)
1078 Posterior Properties of the Nakagami-m Distribution Using Noninformative Priors and Applications in Reliability
Pedro Luiz Ramos, Francisco Louzada, Eduardo Ramos IEEE Transactions on Reliability 67 1 105–117 2018 7.79
平均評価: / 5 ( 件のレビュー)
1079 Model Uncertainty in Accelerated Degradation Testing Analysis
Le Liu, Xiao-Yang Li, Enrico Zio, Rui Kang, Tong-Min Jiang IEEE Transactions on Reliability 66 3 603–615 2017 7.79
平均評価: / 5 ( 件のレビュー)
1080 Reliability Modeling on Consecutive-kr -out-of-nr:F Linear Zigzag Structure and Circular Polygon Structure
Cong Lin, Lirong Cui, David W. Coit, Min Lv IEEE Transactions on Reliability 65 3 1509–1521 2016 7.79
平均評価: / 5 ( 件のレビュー)