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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
1041 A Systematic Study on Factors Impacting GUI Traversal-Based Test Case Generation Techniques for Android Applications
Bo Jiang, Yaoyue Zhang, Wing Kwong Chan, Zhenyu Zhang IEEE Transactions on Reliability 68 3 913–926 2019 11.47
平均評価: / 5 ( 件のレビュー)
1042 A Novel Lifetime Estimation Method for Two-Phase Degrading Systems
Jian-Xun Zhang, Chang-Hua Hu, Xiao He, Xiao-Sheng Si, Yang Liu, Dong-Hua Zhou IEEE Transactions on Reliability 68 2 689–709 2019 11.47
平均評価: / 5 ( 件のレビュー)
1043 Fast Algorithm for Searching d -MPs for all Possible d
Wei-Chang Yeh IEEE Transactions on Reliability 67 1 308–315 2018 11.47
平均評価: / 5 ( 件のレビュー)
1044 A Shock-Based Model for the Reliability of Three-State Networks
Somayeh Ashrafi, Somayeh Zarezadeh IEEE Transactions on Reliability 67 1 274–284 2018 11.47
平均評価: / 5 ( 件のレビュー)
1045 Degradation Models With Wiener Diffusion Processes Under Calibrations
Lirong Cui, Jinbo Huang, Yan Li IEEE Transactions on Reliability 65 2 613–623 2016 11.47
平均評価: / 5 ( 件のレビュー)
1046 Two-Stage Distributionally Robust Optimization for Infrastructure Resilience Enhancement: A Case Study of 220 kV Power Substations Under Earthquake Disasters
Changjie Zou, Kai Wang, Tangfan Xiahou, Di Cao, Yu Liu IEEE Transactions on Reliability 74 2 2576–2590 2025 11.46
平均評価: / 5 ( 件のレビュー)
1047 Validation of a Link-Function Assumption in Type-II Censored Constant Stress Experiments
Thomas Seiche, Udo Kamps IEEE Transactions on Reliability 70 2 525–534 2021 11.46
平均評価: / 5 ( 件のレビュー)
1048 Susceptibility of Operational Amplifiers to Conducted EMI Injected Through the Ground Plane into Their Output Terminal
Anna Richelli, Giovanni Delaini, Marco Grassi, Jean-Michel Redouté IEEE Transactions on Reliability 65 3 1369–1379 2016 11.46
平均評価: / 5 ( 件のレビュー)
1049 Deep Attention Relation Network: A Zero-Shot Learning Method for Bearing Fault Diagnosis Under Unknown Domains
Zuoyi Chen, Jun Wu, Chao Deng, Xiaoqi Wang, Yuanhang Wang IEEE Transactions on Reliability 72 1 79–89 2023 11.45
平均評価: / 5 ( 件のレビュー)
1050 An O(log2(N)) Algorithm for Reliability Evaluation of h-Extra Edge-Connectivity of Folded Hypercubes
Mingzu Zhang, Lianzhu Zhang, Xing Feng, Hong-Jian Lai IEEE Transactions on Reliability 67 1 297–307 2018 11.45
平均評価: / 5 ( 件のレビュー)