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アクセスランキング(PKV)

Currently viewing Reliability and Quality Engineering Field Ranking

順位 タイトル
著者 雑誌 巻 号 ページ 年 PKVアクセス数
991 Performance Assessment of a Wind Turbine Using SCADA based Gaussian Process Model
Ravi Kumar Pandit, David Infield International Journal of Prognostics and Health Management 9 1 2702–None 2018 11.69
平均評価: / 5 ( 件のレビュー)
992 Component Level Versus System Level k-Out-of-n Assembly Systems
Gaofeng Da, Weiyong Ding IEEE Transactions on Reliability 65 1 425–433 2016 11.69
平均評価: / 5 ( 件のレビュー)
993 FedGDD: Defending Federated Learning Against Targeted Model Poisoning Sybil Attacks Based on Gradient Drift Detection
Qi Xiong, Hai Dong, Nasrin Sohrabi, Zahir Tari IEEE Transactions on Reliability 75 1 2052–2066 2026 11.67
平均評価: / 5 ( 件のレビュー)
994 Sensory-Based Failure Threshold Estimation for Remaining Useful Life Prediction
Abdallah Chehade, Scott Bonk, Kaibo Liu IEEE Transactions on Reliability 66 3 939–949 2017 11.67
平均評価: / 5 ( 件のレビュー)
995 Improved Dynamic Dependability Assessment Through Integration With Prognostics
Jose Ignacio Aizpurua, Victoria M. Catterson, Yiannis Papadopoulos, Ferdinando Chiacchio, Gabriele Manno IEEE Transactions on Reliability 66 3 893–913 2017 11.67
平均評価: / 5 ( 件のレビュー)
996 Bayesian Prediction Regions and Density Estimation With Type-2 Censored Data
Akbar Asgharzadeh, Éric Marchand, Ali Saadati Nik IEEE Transactions on Reliability 74 2 2827–2836 2025 11.65
平均評価: / 5 ( 件のレビュー)
997 Robust Inference Based On the Complementary Hamiltonian Monte Carlo
Xiaopeng Xu, Chuancai Liu, Hongji Yang IEEE Transactions on Reliability 71 1 111–126 2022 11.62
平均評価: / 5 ( 件のレビュー)
998 Effort-Aware Just-in-Time Bug Prediction for Mobile Apps Via Cross-Triplet Deep Feature Embedding
Zhou Xu, Kunsong Zhao, Tao Zhang, Chunlei Fu, Meng Yan, Zhiwen Xie, Xiaohong Zhang, Gemma Catolino IEEE Transactions on Reliability 71 1 204–220 2022 11.62
平均評価: / 5 ( 件のレビュー)
999 Multisource Imprecise Information Calibration for Reliability Assessment of Multistate Systems: A Consensus Reaching Perspective
Ruijie Liu, Tangfan Xiahou, Yu Liu IEEE Transactions on Reliability 74 1 2226–2240 2025 11.6
平均評価: / 5 ( 件のレビュー)
1000 Overdispersion Effects on Reliability Test Planning
Arturo J. Fernández, Carlos J. Pérez-González, Andrés Carrión-García, Vicent Giner-Bosch IEEE Transactions on Reliability 72 3 1053–1063 2023 11.6
平均評価: / 5 ( 件のレビュー)