Substructural Properties and Anisotropic Peak Broadening in Zn1−x Mn x Te Films Determined by a Combined Methodology Based on SEM, HRTEM, XRD, and HRXRD
['C. Martinez-Tomas', 'O. Klymov', 'V. Muñoz-Sanjosé']
/
Metallurgical and Materials Transactions A
/ Vol. 47
/ No. 12
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