Review: defect–process–application mapping for high-purity silica via hydrothermal, sol–gel, and CVD routes
['Fenghui Guo', 'Jiahang Fan', 'Yifei Liu', 'Zijiao Guo', 'Qianchao Ma', 'Xiwen Yu', 'Guocheng Lv', 'Yuena Jiang', 'Minghao Fang', 'Huachao Zai', 'Xin Min', 'Ruiyu Mi', 'Xiaowen Wu', 'Yangai Liu', 'Zhaohui Huang']
/
Journal of Materials Science
/ Vol. 61
/ No. 42
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