A reliability analysis for electronic devices under an extension of exponentiated perks distribution
['Luis Carlos Méndez‐González', 'Luis Alberto Rodríguez‐Picón', 'Ivan Juan Carlos Pérez‐Olguin', 'Vicente Garcia', 'Abel Eduardo Quezada‐Carreón']
/
Quality and Reliability Engineering International
/ Vol. 39
/ No. 3
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