Inference on an Adaptive Accelerated Life Test with Application to Smart-Grid Data-Acquisition-Devices
['Lijuan Shen', 'Dayu Sun', 'Zhisheng Ye', 'Xingqiu Zhao']
/
Journal of Quality Technology
/ Vol. 49
/ No. 3
0.0 / 5
0
Reviews
You must log in to post, edit and delete a review.
Log in
Earn 50 points when your review is published.
About KnowledgeRank Points
No reviews have been posted yet. Be the first to write one!