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Bayesian latent degradation performance modeling and quantification of corroding aluminum alloys
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Xuxue Sun, Hesham Mraied, Wenjun Cai, Qiong Zhang, Guoyuan Liang, Mingyang Li
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178 |
None |
84–96 |
2018 |
3.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Entering data correctly: An empirical evaluation of the theory of planned behaviour in the context of manual data acquisition
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Tom Haegemans, Monique Snoeck, Wilfried Lemahieu
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178 |
None |
12–30 |
2018 |
3.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Evaluation of risk impact of completion time changes combining PSA and DSA model insight and human reliability analysis
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P. Martorell, I. Martón, A.I. Sánchez, S. Martorell, F. Sanchez-Saez, M. Saiz
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178 |
None |
97–107 |
2018 |
3.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Application of shutdown probabilistic safety assessment
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Marko Čepin
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178 |
None |
147–155 |
2018 |
5.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Dynamical accelerated performance measure approach for efficient reliability-based design optimization with highly nonlinear probabilistic constraints
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Behrooz Keshtegar, Souvik Chakraborty
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178 |
None |
69–83 |
2018 |
4.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Novel methodology for optimising the design, operation and maintenance of a multi-AGV system
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Rundong Yan, S.J. Dunnett, L.M. Jackson
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178 |
None |
130–139 |
2018 |
5.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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A novel speech-act coding scheme to visualize the intention of crew communications to cope with simulated off-normal conditions of nuclear power plants
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Jinkyun Park, Yochan Kim
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178 |
None |
236–246 |
2018 |
4.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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Reliability-based sensitivity estimators of rare event probability in the presence of distribution parameter uncertainty
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Vincent Chabridon, Mathieu Balesdent, Jean-Marc Bourinet, Jérôme Morio, Nicolas Gayton
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178 |
None |
164–178 |
2018 |
3.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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A control-guided failure restoration framework for the design of resilient engineering systems
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Nita Yodo, Pingfeng Wang
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178 |
None |
179–190 |
2018 |
5.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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A stochastic process based reliability prediction method for LED driver
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Bo Sun, Xuejun Fan, Willem van Driel, Chengqiang Cui, Guoqi Zhang
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178 |
None |
140–146 |
2018 |
5.0 |
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Average Rating: 0.0 / 5
(0 Reviews)
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