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Quality and Reliability Engineering International - 巻 36 / 号 4

タイトル
著者 巻 号 ページ 年 PKV
Defect pattern recognition on wafers using convolutional neural networks
Rui Wang, Nan Chen 36 4 1245–1257 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Control charts for monitoring the median parameter of Birnbaum‐Saunders distribution
Marcelo Bourguignon, Linda Lee Ho, Fidel Henrique Fernandes 36 4 1333–1363 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Comparison of conditional main effects analysis to the analysis of follow‐up experiments for separating confounded two‐factor interaction effects in 2IVk−p fractional factorial experiments
John Lawson 36 4 1454–1472 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A variable parameters multivariate control chart for simultaneous monitoring of the process mean and variability with measurement errors
Hamed Sabahno, Philippe Castagliola, Amirhossein Amiri 36 4 1161–1196 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A one‐class peeling method for multivariate outlier detection with applications in phase I SPC
Waldyn G. Martinez, Maria L. Weese, L. Allison Jones-Farmer 36 4 1272–1295 2020 0.0
平均評価: 0.0 / 5 (0 件のレビュー)