Quality and Reliability Engineering International - 巻 33 / 号 8
| タイトル | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| 著者 | 巻 | 号 | ページ | 年 | PKV | ||||
| An ensemble model for engineered systems prognostics combining health index synthesis approach and particle filtering | |||||||||
| Li Yongxiang, Shi Jianming, Wang Gong, Zhang Mengying | 33 | 8 | 2711–2725 | 2017 | 0.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| Bayesian assurance tests for degradation data | |||||||||
| B.P. Weaver, M.S. Hamada, A.G. Wilson, J.E. Bakerman | 33 | 8 | 2699–2709 | 2017 | 0.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| Detecting changes in location using distribution‐free control charts with big data | |||||||||
| R. Sparks, S. Chakraborti | 33 | 8 | 2577–2595 | 2017 | 0.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| The double sampling range chart | |||||||||
| Antonio Costa | 33 | 8 | 2739–2745 | 2017 | 0.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| Designing Phase I Shewhart X¯charts: Extended tables and software | |||||||||
| Y. Yao, C.W. Hilton, S. Chakraborti | 33 | 8 | 2667–2672 | 2017 | 0.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data | |||||||||
| Vera Hofer, Johannes Leitner, Horst Lewitschnig, Thomas Nowak | 33 | 8 | 2673–2683 | 2017 | 0.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| Bayesian optimum life testing plans under progressive Type‐I interval censoring scheme | |||||||||
| Soumya Roy, Biswabrata Pradhan | 33 | 8 | 2727–2737 | 2017 | 0.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| A comparison study of control charts for Weibull distributed time between events | |||||||||
| Fu‐Kwun Wang, Berihun Bizuneh, Temesgen Hailegiorgis Abebe | 33 | 8 | 2747–2759 | 2017 | 0.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||
| Exploring observational data | |||||||||
| Douglas Montgomery | 33 | 8 | 1639–1640 | 2017 | 0.0 | ||||
| 平均評価: 0.0 / 5 (0 件のレビュー) | |||||||||