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Quality and Reliability Engineering International - 巻 33 / 号 8

タイトル
著者 巻 号 ページ 年 PKV
Wafer yield prediction using derived spatial variables
Hang Dong, Nan Chen, Kaibo Wang 33 8 2327–2342 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
An integrated preventive maintenance and production planning model with sequence‐dependent setup costs and times
Xuejuan Liu, Wenbin Wang, Rui Peng 33 8 2451–2461 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
An exponentially weighted moving average chart based on likelihood‐ratio test for monitoring Weibull mean and variance with subgroups
Fu‐Kwun Wang, Xiao‐Bin Cheng 33 8 2409–2421 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Run Rules median control charts for monitoring process mean in manufacturing
Kim Phuc Tran 33 8 2437–2450 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Multi‐system reliability trend analysis model using incomplete data with application to tank maintenance
Il Yong Na, Woojin Chang 33 8 2385–2395 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Monitoring simple linear profiles in the presence of generalized autoregressive conditional heteroscedasticity
Reza Hadizadeh, Paria Soleimani 33 8 2423–2436 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
An adaptive EWMA scheme‐based CUSUM accumulation error for efficient monitoring of process location
Babar Zaman, Muhammad Hisyam Lee, Muhammad Riaz, Mu'azu Ramat Abujiya 33 8 2463–2482 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
Methods for interpreting the out‐of‐control signal of multivariate control charts: A comparison study
Sotiris Bersimis, Aggeliki Sgora, Stelios Psarakis 33 8 2295–2326 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
A Bayesian analysis of reliability improvement experiments
I‐Tang Yu 33 8 2531–2538 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)
New EWMA control charts for monitoring process dispersion using auxiliary information
Abdul Haq 33 8 2597–2614 2017 0.0
平均評価: 0.0 / 5 (0 件のレビュー)