971
Attention-Based Mask Network Model for Multirate Sampling Data Fault Diagnosis
Keke Huang, Zeyi Liu, Shujie Wu, Chunhua Yang, Weihua Gui
IEEE Transactions on Reliability
74
4
5592–5602
2025
7.81
平均評価: 0.0 / 5
(0 件のレビュー)
972
Model Predictive Control on the Neural Manifold
Christof Fehrman, C. Daniel Meliza
Neural Computation
37
12
2125–2157
2025
7.81
平均評価: 0.0 / 5
(0 件のレビュー)
973
地盤改良をとりまく近年の話題
小林 泰三
材料
74
11
707–710
2025
7.81
平均評価: 0.0 / 5
(0 件のレビュー)
974
A Physical-Statistical Framework on Complex Mechanical System Fault Isolation
Bingxin Yan, Qiuzhuang Sun, Lijuan Shen, Xiaobing Ma
IEEE Transactions on Reliability
74
3
4091–4105
2025
7.81
平均評価: 0.0 / 5
(0 件のレビュー)
975
Inference of Historical Abusive Operations on Li-Ion Batteries Using Series Voltage Synchronicity
Jiale Xie, Yuankai Li, Zongshang Hou, Kailong Liu, Fei Feng
IEEE Transactions on Reliability
74
3
3977–3989
2025
7.81
平均評価: 0.0 / 5
(0 件のレビュー)
976
Semantic Structure Invariance-Based Metamorphic Testing for Machine Translation Systems
Chang-ai Sun, Jian Mu, Mingjun Xiao, Huai Liu, Pinjia He
IEEE Transactions on Reliability
74
3
3251–3265
2025
7.81
平均評価: 0.0 / 5
(0 件のレビュー)
977
Constructions of Adaptively Decodable Visual Secret Sharing Scheme on Background Color
Masanori HIROTOMO, Atsushi MARUI, Yoshiaki SHIRAISHI
IEICE Transactions in Information and Systems
108
12
1442–1450
2025
7.79
平均評価: 0.0 / 5
(0 件のレビュー)
978
Combustion Condition Identification though Flame Imaging and Convolutional Autoencoder
Zewen QIAN, Zhezhe HAN, Haoran JIANG, Ziyi ZHANG, Mohan ZHANG, Hao MA, ...
IEICE Transactions in Information and Systems
108
10
1283–1286
2025
7.79
平均評価: 0.0 / 5
(0 件のレビュー)
979
Aircraft Engine Remaining Useful Life Estimation via a Graph Attention Reconcile Network Model Based on Physical Equations and Sensor Data
Wenyue Cui, Shuo Zhang, Tao Sun, Rui Wang
IEEE Transactions on Reliability
74
4
5244–5258
2025
7.79
平均評価: 0.0 / 5
(0 件のレビュー)
980
Electronic Reliability and Error Performance Analysis of RIS-Aided Communication Networks
Atiquzzaman Mondal, Keshav Singh, Sudip Biswas
IEEE Transactions on Reliability
74
3
3708–3717
2025
7.79
平均評価: 0.0 / 5
(0 件のレビュー)