9761
Automated Testing of Android Apps: A Systematic Literature Review
Pingfan Kong, Li Li, Jun Gao, Kui Liu, Tegawendé F. Bissyandé, Jacques Klein
IEEE Transactions on Reliability
68
1
45–66
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
9762
Security Testbed for Internet-of-Things Devices
Shachar Siboni, Vinay Sachidananda, Yair Meidan, Michael Bohadana, Yael Mathov, Suhas Bhairav, Asaf Shabtai, Yuval Elovici
IEEE Transactions on Reliability
68
1
23–44
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
9763
Type Learning for Binaries and Its Applications
Zhiwu Xu, Cheng Wen, Shengchao Qin
IEEE Transactions on Reliability
68
3
893–912
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
9764
Toward Better Summarizing Bug Reports With Crowdsourcing Elicited Attributes
He Jiang, Xiaochen Li, Zhilei Ren, Jifeng Xuan, Zhi Jin
IEEE Transactions on Reliability
68
1
2–22
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
9765
A Systematic Study on Factors Impacting GUI Traversal-Based Test Case Generation Techniques for Android Applications
Bo Jiang, Yaoyue Zhang, Wing Kwong Chan, Zhenyu Zhang
IEEE Transactions on Reliability
68
3
913–926
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
9766
Adaptive Fault Detection and Isolation for Active Suspension Systems With Model Uncertainties
Shuai Yan, Weichao Sun, Fenghua He, Jianyong Yao
IEEE Transactions on Reliability
68
3
927–937
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
9767
Imperfect Inspection of a System With Unrevealed Failure and an Unrevealed Defective State
Cristiano A. V. Cavalcante, Philip A. Scarf, M. D. Berrade
IEEE Transactions on Reliability
68
2
764–775
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
9768
Optimum Periodic Component Reallocation and System Replacement Maintenance
Yuqiang Fu, Tao Yuan, Xiaoyan Zhu
IEEE Transactions on Reliability
68
2
753–763
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
9769
Scheduling Preventive Maintenance Considering the Saturation Effect
Qiuzhuang Sun, Zhi-Sheng Ye, Weiwen Peng
IEEE Transactions on Reliability
68
2
741–752
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)
9770
A New Subtraction-Based Algorithm for the d-MPs for All d Problem
Wei-Chang Yeh, Ming J. Zuo
IEEE Transactions on Reliability
68
3
999–1008
2019
1.0
平均評価: 0.0 / 5
(0 件のレビュー)