951
A Note on the Component (Extra) Edge Connectivity of the Cartesian Powers of Regular Multiprocessor Systems
Liqiong Xu, Shuming Zhou
IEEE Transactions on Reliability
74
3
4245–4252
2025
7.85
平均評価: 0.0 / 5
(0 件のレビュー)
952
Efficient modeling of stationary interval processes with spline and convolution-based kernels
Chen Li, Feng Wu, Jun Yan
Structural and Multidisciplinary Optimization
68
10
208–None
2025
7.85
平均評価: 0.0 / 5
(0 件のレビュー)
953
一面せん断試験による鋼材と土質材料間の凍着に及ぼす表面粗さの研究
向 稀美郎, 長谷川 洋平, 関谷 宏介, 伊藤 譲, 隅谷 大作, 右田 怜央
材料
75
1
79–84
2026
7.84
平均評価: 0.0 / 5
(0 件のレビュー)
954
Integrated 3D assessment framework for fretting wear and fretting fatigue life of helical wires in steel ropes under service loading
Huan Yan, Huile Li, Chunxi Li
International Journal of Fatigue
205
None
109417–None
2026
7.83
平均評価: 0.0 / 5
(0 件のレビュー)
955
Interference Suppression of Nonstationary Signals for Bearing Diagnosis Under Transient Noise Measurements
Peng Chen, Yuhao Wu, Chaojun Xu, Cheng-Geng Huang, Mian Zhang, Junlin Yuan
IEEE Transactions on Reliability
74
3
4047–4061
2025
7.83
平均評価: 0.0 / 5
(0 件のレビュー)
956
ヒステリシス特性を模擬した3次元弾性リングモデルによるタイヤ転がり面圧分布の実験的検証
中西 亮太, 松原 真己, 鈴木 晴之, 河村 庄造, 田尻 大樹
日本機械学会論文集
91
951
25–00136
2025
7.83
平均評価: 0.0 / 5
(0 件のレビュー)
957
Cross-Domain Adaptation Fault Diagnosis With Maximum Classifier Discrepancy and Deep Feature Alignment Under Variable Working Conditions
Jian Li, Wu Deng, Xiangjun Dang, Huimin Zhao
IEEE Transactions on Reliability
74
3
4106–4115
2025
7.83
平均評価: 0.0 / 5
(0 件のレビュー)
958
Finite Element Analysis of Stress Distribution During the Pin Bending Process of SMD Diodes
Yongkun Wang, Qiang Fu, Haozheng Liu, Yang Shi, Zhao Li, Ding Xia, Wenlong Song
IEEE Transactions on Reliability
74
4
5381–5389
2025
7.83
平均評価: 0.0 / 5
(0 件のレビュー)
959
An Ensemble Data-Model-Label Three-Level Regularization Framework for Imbalanced Intelligent Fault Diagnosis
Yixiong Luo, Jianhua Shi, Jinbiao Tan, Zijie Ren, Jiafu Wan, Mejdl Safran, Salman A. AlQahtani
IEEE Transactions on Reliability
74
3
3884–3896
2025
7.83
平均評価: 0.0 / 5
(0 件のレビュー)
960
Terminating the Reliability Growth Test Under Small Sample Failure Dataset
Wenjie Dong, Jinyan Guo, Lianyi Liu, Yingjie Yang
IEEE Transactions on Reliability
74
4
4832–4841
2025
7.83
平均評価: 0.0 / 5
(0 件のレビュー)